LE

Laertis Economikos

IBM: 67 patents #1,125 of 70,183Top 2%
Globalfoundries: 36 patents #68 of 4,424Top 2%
Infineon Technologies Ag: 7 patents #2,021 of 7,486Top 30%
SS Stmicroelectronics Sa: 3 patents #449 of 1,676Top 30%
GU Globalfoundries U.S.: 3 patents #166 of 665Top 25%
NS Novellus Systems: 1 patents #479 of 780Top 65%
GP Globalfoundries Singapore Pte.: 1 patents #427 of 828Top 55%
Applied Materials: 1 patents #4,780 of 7,310Top 70%
📍 Wappingers Falls, NY: #11 of 884 inventorsTop 2%
🗺 New York: #469 of 115,490 inventorsTop 1%
Overall (All Time): #12,416 of 4,157,543Top 1%
108
Patents All Time

Issued Patents All Time

Showing 51–75 of 108 patents

Patent #TitleCo-InventorsDate
8143166 Polishing method with inert gas injection Feng Zhao, Wu Ping Liu, John Sudijono, Lawrence A. Clevenger 2012-03-27
8117568 Apparatus, method and computer program product for fast simulation of manufacturing effects during integrated circuit design Hua Xiang, Mohammed Fazil Fayaz, Stephen E. Greco, Patricia A. O'Neil, Ruchir Puri 2012-02-14
7993498 Apparatus and method of electrolytic removal of metals from a wafer surface Hariklia Deligianni, Catherine Ivers, Xiaoyan Shao 2011-08-09
7473159 Detection of diamond contamination in polishing pad and reconditioning system therefor John A. Fitzsimmons 2009-01-06
7470985 Solder connector structure and method Mukta G. Farooq, Ian D. Melville, Kevin S. Petrarca, Richard P. Volant 2008-12-30
7354333 Detection of diamond contamination in polishing pad John A. Fitzsimmons 2008-04-08
7214623 Planarization system and method using a carbonate containing fluid Donald J. Delehanty, James Hannah, Daniel Heenan, Fen F. Jamin 2007-05-08
7091103 TEOS assisted oxide CMP process Jochen Beintner, Michael Wise, Andreas Knorr 2006-08-15
7040966 Carbonation of pH controlled KOH solution for improved polishing of oxide films on semiconductor wafers Joseph F. Salfelder, Wayne R. Swart, Gopalakrishna B. Prabhu, Srinivas R. Mirmira, Fen F. Jamin +3 more 2006-05-09
6869860 Filling high aspect ratio isolation structures with polysilazane based material Michael P. Belyansky, Rama Divakaruni, Rajarao Jammy, Kenneth Settlemeyer, Padraic Shafer 2005-03-22
6794242 Extendible process for improved top oxide layer for DRAM array and the gate interconnects while providing self-aligned gate contacts Thomas W. Dyer, Andreas Knorr, Scott D. Halle, Rajeev Malik, Norbert Arnod 2004-09-21
6776885 Integrated plating and planarization apparatus having a variable-diameter counterelectrode Hariklia Deligianni, John M. Cotte, Panayotis Andricacos 2004-08-17
6773570 Integrated plating and planarization process and apparatus therefor Hariklia Deligianni, John M. Cotte, Henry Grabarz, Bomy Chen 2004-08-10
6656817 Method of filling isolation trenches in a substrate Ramachandra Divakaruni, Byeong Y. Kim 2003-12-02
6596580 Recess Pt structure for high k stacked capacitor in DRAM and FRAM, and the method to form this structure Jingyu Lian, Greg Costrini, Michael Wise 2003-07-22
6569769 Slurry-less chemical-mechanical polishing Alexander William Simpson, Ravikumar Ramachandran 2003-05-27
6485355 Method to increase removal rate of oxide using fixed-abrasive Alexander William Simpson 2002-11-26
6448169 Apparatus and method for use in manufacturing semiconductor devices William Brearley, Paul F. Findeis, Kimberley A. Kelly, Bouwe W. Leenstra, Arthur G. Merryman +4 more 2002-09-10
6444919 Thin film wiring scheme utilizing inter-chip site surface wiring Mukta S. Farooq, Michael F. McAllister, Eric D. Perfecto, Chandrika Prasad, Keshav Prasad +3 more 2002-09-03
6429149 Low temperature LPCVD PSG/BPSG process Ashima B. Chakravarti, Richard A. Conti, Byeongju Park 2002-08-06
6403412 Method for in-situ formation of bottle shaped trench by gas phase etching Byeongju Park 2002-06-11
6368969 Chemical-mechanical polishing methods Fen F. Jamin 2002-04-09
6365328 Semiconductor structure and manufacturing method Hua Shen, David E. Kotecki, Satish D. Athavale, Jenny Lian, Fen F. Jamin +2 more 2002-04-02
6358850 Slurry-less chemical-mechanical polishing of oxide materials Sumit Pandey, Ronald J. Schutz, Ravikumar Ramachandran 2002-03-19
6359300 High aspect ratio deep trench capacitor having void-free fill Byeongju Park 2002-03-19