JL

Jingyu Lian

Infineon Technologies Ag: 26 patents #247 of 7,486Top 4%
IBM: 6 patents #16,453 of 70,183Top 25%
CM Chartered Semiconductor Manufacturing: 2 patents #256 of 840Top 35%
KT Kabushiki Kaisha Toshiba: 2 patents #9,982 of 21,451Top 50%
Samsung: 2 patents #37,631 of 75,807Top 50%
📍 Wallkill, NY: #6 of 69 inventorsTop 9%
🗺 New York: #4,427 of 115,490 inventorsTop 4%
Overall (All Time): #137,425 of 4,157,543Top 4%
28
Patents All Time

Issued Patents All Time

Showing 1–25 of 28 patents

Patent #TitleCo-InventorsDate
11847398 Automatic generation of ground rule verification macros Shruthi Venkateshan, Tenko Yamashita, Jinning Liu 2023-12-19
9070759 Semiconductor device and method of making same Jin-Ping Han, Haoren Zhuang, Jiang Yan, Manfred Eller 2015-06-30
8697339 Semiconductor device manufacturing methods Haoren Zhuang, Chong-Kwang Chang, Alois Gutmann, Matthias Lipinski, Len Yuan Tsou +1 more 2014-04-15
8394574 Metrology systems and methods for lithography processes Chandrasekhar Sarma, Matthias Lipinski, Haoren Zhuang 2013-03-12
8349528 Semiconductor devices and methods of manufacturing thereof Matthias Lipinski, Alois Gutmann, Chandrasekhar Sarma, Haoren Zhuang 2013-01-08
8138055 Semiconductor devices having pFET with SiGe gate electrode and embedded SiGe source/drain regions and methods of making the same Jin-Ping Han, Alois Gutmann, Roman Knoefler, Jiang Yan, Chris Stapelmann +1 more 2012-03-20
8067135 Metrology systems and methods for lithography processes Chandrasekhar Sarma, Matthias Lipinski, Haoren Zhuang 2011-11-29
8063406 Semiconductor device having a polysilicon layer with a non-constant doping profile Haoren Zhuang, Matthias Lipinski, Chandrasekhar Sarma 2011-11-22
8007985 Semiconductor devices and methods of manufacturing thereof Matthias Lipinski, Alois Gutmann, Chandrasekhar Sarma, Haoren Zhuang 2011-08-30
7842579 Method for manufacturing a semiconductor device having doped and undoped polysilicon layers Haoren Zhuang, Matthias Lipinski, Chandrasekhar Sarma 2010-11-30
7800182 Semiconductor devices having pFET with SiGe gate electrode and embedded SiGe source/drain regions and methods of making the same Jin-Ping Han, Alois Gutmann, Roman Knoefler, Jiang Yan, Chris Stapelmann +1 more 2010-09-21
7794903 Metrology systems and methods for lithography processes Chandrasekhar Sarma, Matthias Lipinski, Haoren Zhuang 2010-09-14
7745292 Method for fabricating a semiconductor gate structure Jong-Pyo Kim 2010-06-29
7674350 Feature dimension control in a manufacturing process Haoren Zhuang, Alois Gutmann, Matthias Lipinski, Chandrasekhar Sarma 2010-03-09
7586158 Piezoelectric stress liner for bulk and SOI Matthias Hierlemann, Rudolf Stierstorfer 2009-09-08
7378700 Self-aligned V0-contact for cell size reduction Nicolas Nagel, Stefan Gernhardt, Rainer Bruchhaus, Andreas Hilliger, Uwe Wellhausen 2008-05-27
7319270 Multi-layer electrode and method of forming the same Chenting Lin, Nicolas Nagel, Michael Wise 2008-01-15
7270884 Adhesion layer for Pt on SiO2 Kwong Hon Wong, Michael Wise, Young Limb, Nicolas Nagel 2007-09-18
7061035 Self-aligned V0-contact for cell size reduction Nicolas Nagel, Stefan Gernhardt, Rainer Bruchhaus, Andreas Hilliger, Uwe Wellhausen 2006-06-13
7042705 Sidewall structure and method of fabrication for reducing oxygen diffusion to contact plugs during CW hole reactive ion etch processing Haoren Zhuang, Ulrich Egger, Kazuhiro Tomioka, Nicolas Nagel, Andreas Hilliger +1 more 2006-05-09
7001780 Method of fabrication of an FeRAM capacitor and an FeRAM capacitor formed by the method Haoren Zhuang, Ulrich Egger, Stefan Gernhardt, Hiroyuki Kanaya 2006-02-21
6984555 Device and method for inhibiting oxidation of contact plugs in ferroelectric capacitor devices 2006-01-10
6897501 Avoiding shorting in capacitors Haoren Zhuang, Ulrich Egger, Gerhard Beitel, Karl Hornik 2005-05-24
6839220 Multi-layer barrier allowing recovery anneal for ferroelectric capacitors Andreas Hilliger, Nicolas Nagel, Rainer Bruchhaus, Stefan Gernhardt, Uwe Wellhausen +2 more 2005-01-04
6794705 Multi-layer Pt electrode for DRAM and FRAM with high K dielectric materials Chenting Lin, Nicolas Nagel, Michael Wise 2004-09-21