MK

Marcus Adrianus Van De Kerkhof

AB Asml Netherlands B.V.: 101 patents #16 of 3,192Top 1%
AN Asml Holding N.V.: 7 patents #73 of 520Top 15%
CG Carl Zeiss Smt Gmbh: 1 patents #657 of 1,189Top 60%
📍 Helmond, NL: #2 of 250 inventorsTop 1%
Overall (All Time): #13,881 of 4,157,543Top 1%
102
Patents All Time

Issued Patents All Time

Showing 51–75 of 102 patents

Patent #TitleCo-InventorsDate
9482967 Lithographic apparatus, control system and device manufacturing method Johannes Henricus Wilhelmus Jacobs, Tammo Uitterdijk, Nicolas Lallemant 2016-11-01
9436099 Lithographic focus and dose measurement using a 2-D target Christian Marinus Leewis, Hugo Augustinus Joseph Cramer, Johannes Anna Quaedackers, Christine Corinne Mattheus 2016-09-06
9316919 Lithographic apparatus and device manufacturing method Timotheus Franciscus Sengers, Mark Kroon, Kees Van Weert 2016-04-19
9280065 Inspection apparatus to detect a target located within a pattern for lithography 2016-03-08
9255892 Substrate, a method of measuring a property, an inspection apparatus and a lithographic apparatus Maurits Van Der Schaar, Hendrik Jan Hidde Smilde 2016-02-09
9229338 Substrate, a method of measuring a property, an inspection apparatus and a lithographic apparatus Maurits Van Der Schaar, Hendrik Jan Hidde Smilde 2016-01-05
9217916 Lithographic apparatus and device manufacturing method Paul Christiaan Hinnen, Reiner Maria Jungblut, Koenraad Remi André Maria Schreel 2015-12-22
9201310 Method of measuring overlay error and a device manufacturing method Leonardus Henricus Marie Verstappen 2015-12-01
9182678 Lithographic apparatus and device manufacturing method Siebe Landheer, Marcel Beckers, Jeroen Peter Johannes Bruijstens, Ivo Adam Johannes Thomas, Franciscus Johannes Joseph Janssen 2015-11-10
9170498 Lithographic apparatus and a method for determining a polarization property of a projection system using an adjustable polarizer and interferometric sensor Wilhelmus Petrus De Boeij, Hendrikus Robertus Marie Van Greevenbroek, Michel François Hubert Klaassen, Martijn Gerard Dominique Wehrens, Haico Victor Kok +2 more 2015-10-27
9152058 Lithographic apparatus and device manufacturing method involving a member and a fluid opening Joeri Lof, Erik Theodorus Maria Bijlaart, Roelof Aeilko Siebrand Ritsema, Frank Van Schaik, Timotheus Franciscus Sengers +16 more 2015-10-06
9081299 Lithographic apparatus and device manufacturing method involving removal of liquid entering a gap Joeri Lof, Erik Theodorus Maria Bijlaart, Roelof Aeilko Siebrand Ritsema, Frank Van Schaik, Timotheus Franciscus Sengers +16 more 2015-07-14
8988658 Inspection apparatus to detect a target located within a pattern for lithography 2015-03-24
8988653 Lithographic apparatus, distortion determining method, and patterning device Robertus Cornelis Martinus De Kruif 2015-03-24
8982347 Alignment mark deformation estimating method, substrate position predicting method, alignment system and lithographic apparatus Xiuhong Wei, Franciscus Godefridus Casper Bijnen, Richard Johannes Franciscus Van Haren, Everhardus Cornelis Mos, Hubertus Johannes Gertrudus Simons +4 more 2015-03-17
8982329 Method and apparatus for measuring line end shortening, substrate and patterning device Maurits Van Der Schaar, Arie Jeffrey Den Boef, Richard Johannes Franciscus Van Haren 2015-03-17
8947637 Lithographic apparatus and device manufacturing method Timotheus Franciscus Sengers, Mark Kroon, Kees Van Weert 2015-02-03
8947632 Lithographic apparatus, device manufacturing method, and method of applying a pattern to a substrate Frank Staals 2015-02-03
8896817 Lithographic projection apparatus, device manufacturing methods and mask with sensor and diffuser for use in a device manufacturing method Bearrach Moest 2014-11-25
8891061 Lithographic focus and dose measurement using a 2-D target Christian Marinus Leewis, Hugo Augustinus Joseph Cramer, Johannes Anna Quaedackers, Christine Corinne Mattheus 2014-11-18
8860928 Lithographic apparatus, computer program product and device manufacturing method Sytse Postma, Bearrach Moest, Vasco Miguel Matias Serrao 2014-10-14
8848195 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method for determining a property of a substrate Christian Marinus Leewis, Karel Diederick Van Der Mast, Peter Clement Paul Vanoppen, Ruben Alvarez Sanchez 2014-09-30
8830472 Method of assessing a model of a substrate, an inspection apparatus and a lithographic apparatus Arie Jeffrey Den Boef, Hugo Augustinus Joseph Cramer, Henricus Petrus Maria Pellemans, Martin Ebert 2014-09-09
8823919 Lithographic apparatus, removable member and device manufacturing method Nina Vladimirovna Dziomkina, Roelof Frederik De Graaf, Martinus Hendrikus Antonius Leenders, Paulus Martinus Maria Liebregts, Gerardus Martinus Antonius De Rooij +4 more 2014-09-02
8786825 Apparatus and method of measuring a property of a substrate Maurits Van Der Schaar, Andreas Fuchs, Martyn John Coogans 2014-07-22