HK

Haico Victor Kok

AB Asml Netherlands B.V.: 30 patents #121 of 3,192Top 4%
AN Asml Holding N.V.: 2 patents #214 of 520Top 45%
Overall (All Time): #117,244 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDate
12032299 Metrology method and associated metrology and lithographic apparatuses Patricius Aloysius Jacobus Tinnemans, Igor Matheus Petronella Aarts, Kaustuve Bhattacharyya, Ralph Brinkhof, Leendert Jan KARSSEMEIJER +4 more 2024-07-09
11022902 Sensor, lithographic apparatus, and device manufacturing method Arie Jeffrey Den Boef, Patricius Aloysius Jacobus Tinnemans, William Peter Van Drent, Sebastianus Adrianus GOORDEN 2021-06-01
10481507 Measurement method comprising in-situ printing of apparatus mark and corresponding apparatus Kevin J. Violette, Igor Matheus Petronella Aarts, Eric Brian Catey 2019-11-19
9971254 Sensor, lithographic apparatus and device manufacturing method Thibault Simon Mathieu Laurent, Johannes Henricus Wilhelmus Jacobs, Yuri Johannes Gabriël Van De Vijver, Johannes Antonius Maria Van De Wal, Bastiaan Andreas Wilhelmus Hubertus Knarren +6 more 2018-05-15
9891532 Lithographic method to apply a pattern to a substrate and lithographic apparatus 2018-02-13
9864282 Sensor system for lithography Robbert Jan Voogd 2018-01-09
9753382 Sensor, lithographic apparatus and device manufacturing method Thibault Simon Mathieu Laurent, Johannes Henricus Wilhelmus Jacobs, Yuri Johannes Gabriël Van De Vijver, Johannes Antonius Maria Van De Wal, Bastiaan Andreas Wilhelmus Hubertus Knarren +6 more 2017-09-05
9690207 Sensor system for lithography Robbert Jan Voogd 2017-06-27
9423688 Lithographic method to apply a pattern to a substrate and lithographic apparatus 2016-08-23
9331117 Sensor and lithographic apparatus Stoyan Nihtianov, Martijn Gerard Dominique Wehrens 2016-05-03
9170498 Lithographic apparatus and a method for determining a polarization property of a projection system using an adjustable polarizer and interferometric sensor Marcus Adrianus Van De Kerkhof, Wilhelmus Petrus De Boeij, Hendrikus Robertus Marie Van Greevenbroek, Michel François Hubert Klaassen, Martijn Gerard Dominique Wehrens +2 more 2015-10-27
9116446 Lithographic apparatus and method Robbert Jan Voogd, Bearrach Moest, Petrus Franciscus Van Gils 2015-08-25
8760620 Lithographic method to apply a pattern to a substrate and lithographic apparatus 2014-06-24
8629418 Lithographic apparatus and sensor therefor Marcus Adrianus Van De Kerkhof, Borgert Kruizinga, Timotheus Franciscus Sengers, Bearrach Moest, Marc Antonius Maria Haast +3 more 2014-01-14
8482718 Lithographic apparatus and device manufacturing method Wilhelmus Maria Corbeij, Marcus Adrianus Van De Kerkhof 2013-07-09
8436977 Lithographic method to apply a pattern to a substrate and lithographic apparatus 2013-05-07
8049864 Device manufacturing method and lithographic apparatus Johannes Jacobus Matheus Baselmans, Marcus Adrianus Van De Kerkhof 2011-11-01
8013977 Lithographic apparatus, radiation sensor and method of manufacturing a radiation sensor Arie Johan Van Der Sijs 2011-09-06
7773235 Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus Koen Kivits, Ron Van De Laak, Johannes Maria Kuiper, Gerbrand Van Der Zouw, Hoite Pieter Theodoor Tolsma 2010-08-10
7453078 Sensor for use in a lithographic apparatus Marcus Adrianus Van De Kerhof, Borgert Kruizinga, Timotheus Franciscus Sengers, Bearrach Moest, Marc Antonius Maria Haast +3 more 2008-11-18
7443485 Apodization measurement for lithographic apparatus Marcus Adrianus Van De Kerkhof 2008-10-28
7409302 Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus Koen Kivits, Ron Van De Laak, Johannes Maria Kuiper, Gerbrand Van Der Zouw, Hoite Pieter Theodoor Tolsma 2008-08-05
7388652 Wave front sensor with grey filter and lithographic apparatus comprising same Arie Johan Van Der Sijs 2008-06-17
7315353 Apodization measurement for lithographic apparatus Marcus Adrianus Van De Kerkhof 2008-01-01
7308368 Method and apparatus for vibration detection, method and apparatus for vibration analysis, lithographic apparatus, device manufacturing method, and computer program Koen Kivits, Ron Van De Laak, Hans Kuiper 2007-12-11