Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12189314 | Metrology method and associated metrology and lithographic apparatuses | Sebastianus Adrianus GOORDEN, Simon Gijsbert Josephus Mathijssen, Manouk RIJPSTRA, Ralph Brinkhof, Kaustuve Bhattacharyya | 2025-01-07 |
| 12032299 | Metrology method and associated metrology and lithographic apparatuses | Patricius Aloysius Jacobus Tinnemans, Igor Matheus Petronella Aarts, Kaustuve Bhattacharyya, Ralph Brinkhof, Stefan Carolus Jacobus Antonius Keij +4 more | 2024-07-09 |