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Manouk RIJPSTRA

AB Asml Netherlands B.V.: 5 patents #820 of 3,192Top 30%
Overall (All Time): #897,382 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12189314 Metrology method and associated metrology and lithographic apparatuses Sebastianus Adrianus GOORDEN, Simon Gijsbert Josephus Mathijssen, Leendert Jan KARSSEMEIJER, Ralph Brinkhof, Kaustuve Bhattacharyya 2025-01-07
11448973 Computational metrology based correction and control Cornelis Johannes Henricus LAMBREGTS, Wim Tjibbo Tel, Sarathi ROY, Cédric Désiré Grouwstra, Chi-Fei NIEN +3 more 2022-09-20
11029610 Lithographic method Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Ahmet Koray Erdamar, Loek Johannes Petrus Verhees +11 more 2021-06-08
10962887 Lithographic method Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Sudharshanan Raghunathan, Boris Menchtchikov +13 more 2021-03-30
10527958 Lithographic method Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Sudharshanan Raghunathan, Boris Menchtchikov +13 more 2020-01-07