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Chi-Fei NIEN

AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
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Patent #TitleCo-InventorsDate
11448973 Computational metrology based correction and control Manouk RIJPSTRA, Cornelis Johannes Henricus LAMBREGTS, Wim Tjibbo Tel, Sarathi ROY, Cédric Désiré Grouwstra +3 more 2022-09-20