HT

Hoite Pieter Theodoor Tolsma

AB Asml Netherlands B.V.: 20 patents #201 of 3,192Top 7%
Overall (All Time): #217,883 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11977034 Methods and apparatus for measuring a property of a substrate Wouter Lodewijk Elings, Franciscus Bernardus Maria Van Bilsen, Christianus Gerardus Maria De Mol, Everhardus Cornelis Mos, Peter Ten Berge +5 more 2024-05-07
10996176 Methods and apparatus for measuring a property of a substrate Wouter Lodewijk Elings, Franciscus Bernardus Maria Van Bilsen, Christianus Gerardus Maria De Mol, Everhardus Cornelis Mos, Peter Ten Berge +5 more 2021-05-04
10746668 Methods and apparatus for measuring a property of a substrate Wouter Lodewijk Elings, Franciscus Bernardus Maria Van Bilsen, Christianus Gerardus Maria De Mol, Everhardus Cornelis Mos, Peter Ten Berge +5 more 2020-08-18
10705438 Lithographic method Andre Bernardus Jeunink, Laurentius Johannes Adrianus Van Bokhoven, Stan Henricus Van Der Meulen, Yang-Shan Huang, Federico La Torre +4 more 2020-07-07
10571814 Lithographic method Andre Bernardus Jeunink, Laurentius Johannes Adrianus Van Bokhoven, Stan Henricus Van Der Meulen, Yang-Shan Huang, Federico La Torre +4 more 2020-02-25
10317191 Methods and apparatus for measuring a property of a substrate Wouter Lodewijk Elings, Franciscus Bernardus Maria Van Bilsen, Christianus Gerardus Maria De Mol, Everhardus Cornelis Mos, Peter Ten Berge +5 more 2019-06-11
9594029 Methods and apparatus for measuring a property of a substrate Wouter Lodewijk Elings, Franciscus Bernardus Maria Van Bilsen, Christianus Gerardus Maria De Mol, Everhardus Cornelis Mos, Peter Ten Berge +5 more 2017-03-14
8908152 Lithographic apparatus and device manufacturing method to determine improved absolute position of exposure fields using mark structures Franciscus Godefridus Casper Bijnen, Jozef Cornelis Antonius Roijers, Patrick Warnaar, Marc Van Kemenade 2014-12-09
8139217 Alignment systems and methods for lithographic systems Franciscus Bernardus Maria Van Bilsen, Jacobus Burghoorn, Richard Johannes Franciscus Van Haren, Paul Christiaan Hinnen, Hermanus Gerardus Van Horssen +9 more 2012-03-20
7880880 Alignment systems and methods for lithographic systems Franciscus Bernardus Maria Van Bilsen, Jacobus Burghoorn, Richard Johannes Franciscus Van Haren, Paul Christiaan Hinnen, Hermanus Gerardus Van Horssen +9 more 2011-02-01
7773235 Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus Haico Victor Kok, Koen Kivits, Ron Van De Laak, Johannes Maria Kuiper, Gerbrand Van Der Zouw 2010-08-10
7439531 Alignment systems and methods for lithographic systems Franciscus Bernardus Maria Van Bilsen, Jacobus Burghoorn, Richard Johannes Franciscus Van Haren, Paul Christiaan Hinnen, Hermanus Gerardus Van Horssen +9 more 2008-10-21
7410735 Method of characterization, method of characterizing a process operation, and device manufacturing method Maria Elisabeth Reuhman-Huisken, Christianus Gerardus Maria De Mol 2008-08-12
7409302 Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus Haico Victor Kok, Koen Kivits, Ron Van De Laak, Johannes Maria Kuiper, Gerbrand Van Der Zouw 2008-08-05
7332732 Alignment systems and methods for lithographic systems Franciscus Bernardus Maria Van Bilsen, Jacobus Burghoorn, Richard Johannes Franciscus Van Haren, Paul Christiaan Hinnen, Hermanus Gerardus Van Horssen +9 more 2008-02-19
7329888 Alignment systems and methods for lithographic systems Franciscus Bernardus Maria Van Bilsen, Jacobus Burghoorn, Richard Johannes Franciscus Van Haren, Paul Christiaan Hinnen, Hermanus Gerardus Van Horssen +9 more 2008-02-12
7297971 Alignment systems and methods for lithographic systems Franciscus Bernardus Maria Van Bilsen, Jacobus Burghoorn, Richard Johannes Franciscus Van Haren, Paul Christiaan Hinnen, Hermanus Gerardus Van Horssen +9 more 2007-11-20
7259828 Alignment system and method and device manufactured thereby Ramon Navarro Y Koren, Hubertus Johannes Gertrudus Simons, Remi Daniel Marie Edart, Pui Leng LAM, Bernardus Johannes Antonius Hulshof +1 more 2007-08-21
7002667 Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby Leon Martin Levasier, Arie Jeffrey Den Boef, Ingo Dirnstorfer, Andre Bernardus Jeunink, Stefan Geerte Kruijswijk +2 more 2006-02-21
6995831 Lithographic apparatus with alignment subsystem, device manufacturing method, using alignment, and alignment structure Leon Martin Levasier, Arie Jeffrey Den Boef, Ingo Dirnstorfer, Andre Bernardus Jeunink, Stefan Geerte Kruijswijk +2 more 2006-02-07