Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11714357 | Method to predict yield of a device manufacturing process | Alexander Ypma, Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Chenxi Lin, Dag Sonntag +9 more | 2023-08-01 |
| 11086229 | Method to predict yield of a device manufacturing process | Alexander Ypma, Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Chenxi Lin, Dag Sonntag +9 more | 2021-08-10 |
| 9977340 | Method and apparatus for measuring a structure on a substrate, computer program products for implementing such methods and apparatus | Maria Johanna Hendrika Aben, Hugo Augustinus Joseph Cramer, Noelle Martina Wright, Martijn Jaap Daniel Slob | 2018-05-22 |
| 9360768 | Inspection method and apparatus | Gerardo Bottiglieri, Elliott Gerard MC NAMARA | 2016-06-07 |
| 8848195 | Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method for determining a property of a substrate | Christian Marinus Leewis, Marcus Adrianus Van De Kerkhof, Karel Diederick Van Der Mast, Peter Clement Paul Vanoppen | 2014-09-30 |