Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12353967 | Method and apparatus for determining feature contribution to performance | Vahid BASTANI, Reza SAHRAEIAN, Dimitra GKOROU | 2025-07-08 |
| 12045555 | Method to label substrates based on process parameters | Vahid BASTANI, Alexander Ypma, Everhardus Cornelis Mos, Hakki Ergün Cekli, Chenxi Lin | 2024-07-23 |
| 11714357 | Method to predict yield of a device manufacturing process | Alexander Ypma, Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Chenxi Lin, Hakki Ergün Cekli +9 more | 2023-08-01 |
| 11099485 | Maintaining a set of process fingerprints | Alexander Ypma, Vahid BASTANI, Jelle Nije, Hakki Ergün Cekli, Georgios TSIROGIANNIS +1 more | 2021-08-24 |
| 11086229 | Method to predict yield of a device manufacturing process | Alexander Ypma, Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Chenxi Lin, Hakki Ergün Cekli +9 more | 2021-08-10 |