Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12353967 | Method and apparatus for determining feature contribution to performance | Vahid BASTANI, Dag Sonntag, Dimitra GKOROU | 2025-07-08 |
| 11740560 | Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process | Eleftherios KOULIERAKIS, Carlo LANCIA, Juan Manuel Gonzalez Huesca, Alexander Ypma, Dimitra GKOROU | 2023-08-29 |