SF

Su Chen Fan

IBM: 101 patents #555 of 70,183Top 1%
Globalfoundries: 23 patents #124 of 4,424Top 3%
TSMC: 6 patents #3,824 of 12,232Top 35%
GP Globalfoundries Singapore Pte.: 5 patents #141 of 828Top 20%
SS Stmicroelectronics Sa: 1 patents #938 of 1,676Top 60%
BS Beijing Lenovo Software: 1 patents #181 of 493Top 40%
LL Lenovo (Beijing) Limited: 1 patents #602 of 1,308Top 50%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Cohoes, NY: #4 of 185 inventorsTop 3%
🗺 New York: #401 of 115,490 inventorsTop 1%
Overall (All Time): #10,198 of 4,157,543Top 1%
118
Patents All Time

Issued Patents All Time

Showing 51–75 of 118 patents

Patent #TitleCo-InventorsDate
10796957 Buried contact to provide reduced VFET feature-to-feature tolerance requirements Jeffrey C. Shearer, Robert C. Wong, Ruilong Xie 2020-10-06
10727317 Bottom contact formation for vertical transistor devices Ekmini Anuja De Silva, Sivananda K. Kanakasabapathy 2020-07-28
10685876 Liner and cap structures for reducing local interconnect vertical resistance without compromising reliability Hemanth Jagannathan, Raghuveer R. Patlolla, Cornelius Brown Peethala 2020-06-16
10658190 Extreme ultraviolet lithography patterning with directional deposition Yongan Xu, Ekmini Anuja De Silva, Yann Mignot 2020-05-19
10622458 Self-aligned contact for vertical field effect transistor Brent A. Anderson, Steven R. Bentley, Balasubramanian Pranatharthiharan, Junli Wang, Ruilong Xie 2020-04-14
10615027 Stack viabar structures Hsueh-Chung Chen, Yann Mignot, James J. Kelly, Terence B. Hook 2020-04-07
10522654 Gate tie-down enablement with inner spacer Andre P. Labonte, Lars Liebmann, Sanjay C. Mehta 2019-12-31
10497798 Vertical field effect transistor with self-aligned contacts Ruilong Xie, Steven Bentley, Puneet Harischandra Suvarna, Chanro Park, Min Gyu Sung +2 more 2019-12-03
10490653 Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors Zuoguang Liu, Heng Wu, Tenko Yamashita 2019-11-26
10490667 Three-dimensional field effect device Huimei Zhou, Shogo Mochizuki, Peng Xu, Nicolas Loubet 2019-11-26
10388602 Local interconnect structure including non-eroded contact via trenches Vimal Kamineni, Andre P. Labonte, Ruilong Xie 2019-08-20
10332971 Replacement metal gate stack for diffusion prevention Takashi Ando, Johnathan E. Faltermeier, Sivananda K. Kanakasabapathy, Injo Ok, Tenko Yamashita 2019-06-25
10332977 Gate tie-down enablement with inner spacer Andre P. Labonte, Lars Liebmann, Sanjay C. Mehta 2019-06-25
10319835 Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors Zuoguang Liu, Heng Wu, Tenko Yamashita 2019-06-11
10312154 Method of forming vertical FinFET device having self-aligned contacts Ruilong Xie, Steven Bentley, Puneet Harischandra Suvarna, Chanro Park, Min Gyu Sung +2 more 2019-06-04
10217664 Reflow interconnect using Ru Lawrence A. Clevenger, Huai Huang, Koichi Motoyama, Wei Wang, Chih-Chao Yang 2019-02-26
10211101 Reflow interconnect using Ru Lawrence A. Clevenger, Huai Huang, Koichi Motoyama, Wei Wang, Chih-Chao Yang 2019-02-19
10186599 Forming self-aligned contact with spacer first Andrew M. Greene, Sean Lian, Balasubramanian Pranatharthiharan, Mark V. Raymond, Ruilong Xie 2019-01-22
10128352 Gate tie-down enablement with inner spacer Andre P. Labonte, Lars Liebmann, Sanjay C. Mehta 2018-11-13
10020381 Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors Zuoguang Liu, Heng Wu, Tenko Yamashita 2018-07-10
9985027 Stable multiple threshold voltage devices on replacement metal gate CMOS devices Sivananda K. Kanakasabapathy, Injo Ok, Tenko Yamashita 2018-05-29
9960078 Reflow interconnect using Ru Lawrence A. Clevenger, Huai Huang, Koichi Motoyama, Wei Wang, Chih-Chao Yang 2018-05-01
9953978 Replacement gate structures for transistor devices Ruilong Xie, Kisik Choi, Shom Ponoth 2018-04-24
9941163 Gate tie-down enablement with inner spacer Andre P. Labonte, Lars Liebmann, Sanjay C. Mehta 2018-04-10
9929049 Gate tie-down enablement with inner spacer Andre P. Labonte, Lars Liebmann, Sanjay C. Mehta 2018-03-27