RW

Robert C. Wong

IBM: 82 patents #813 of 70,183Top 2%
Globalfoundries: 4 patents #817 of 4,424Top 20%
TE Tessera: 4 patents #104 of 271Top 40%
Infineon Technologies Ag: 4 patents #2,452 of 7,486Top 35%
UM United Microelectronics: 3 patents #1,523 of 4,560Top 35%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
Overall (All Time): #16,753 of 4,157,543Top 1%
93
Patents All Time

Issued Patents All Time

Showing 25 most recent of 93 patents

Patent #TitleCo-InventorsDate
12327730 Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic Fee Li Lie, Dongbing Shao, Yongan Xu 2025-06-10
11978639 Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic Fee Li Lie, Dongbing Shao, Yongan Xu 2024-05-07
RE49794 SRAM design to facilitate single fin cut in double sidewall image transfer process Mary E. Weybright 2024-01-09
11699591 Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic Fee Li Lie, Dongbing Shao, Yongan Xu 2023-07-11
11295995 Testing SRAM structures Alfred Bruno 2022-04-05
11062911 Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic Fee Li Lie, Dongbing Shao, Yongan Xu 2021-07-13
10910041 SRAM cell with dynamic split ground and split wordline 2021-02-02
10804148 Buried contact to provide reduced VFET feature-to-feature tolerance requirements Su Chen Fan, Jeffrey C. Shearer, Ruilong Xie 2020-10-13
10796957 Buried contact to provide reduced VFET feature-to-feature tolerance requirements Su Chen Fan, Jeffrey C. Shearer, Ruilong Xie 2020-10-06
10755773 SRAM cell with dynamic split ground and split wordline 2020-08-25
10699775 SRAM cell with dynamic split ground and split wordline 2020-06-30
10629258 SRAM cell with dynamic split ground and split wordline 2020-04-21
10621295 Incorporation of process variation contours in design rule and risk estimation aspects of design for manufacturability to increase fabrication yield Jinning Liu, Jing Sha, Dongbing Shao 2020-04-14
10614877 4T static random access memory bitcell retention Albert M. Chu, Myung-Hee Na, Sean D. Burns, Jens Haetty 2020-04-07
10573528 Two-color self-aligned double patterning (SADP) to yield static random access memory (SRAM) and dense logic Fee Li Lie, Dongbing Shao, Yongan Xu 2020-02-25
10381068 Ultra dense and stable 4T SRAM cell design having NFETs and PFETs Myung-Hee Na, Jens Haetty, Sean D. Burns 2019-08-13
10366746 SRAM cell with dynamic split ground and split wordline 2019-07-30
10366996 Stable and reliable FinFET SRAM with improved beta ratio Lei Zhuang, Ananthan Raghunathan 2019-07-30
10347327 SRAM cell with dynamic split ground and split wordline 2019-07-09
10096521 SRAM design to facilitate single fin cut in double sidewall image transfer process Mary E. Weybright 2018-10-09
10083272 Integrated circuit design layout optimizer based on process variation and failure mechanism Lawrence A. Clevenger, Jason D. Hibbeler, Dongbing Shao 2018-09-25
9934843 SRAM cell with dynamic split ground and split wordline 2018-04-03
9881668 SRAM cell with dynamic split ground and split wordline 2018-01-30
9799660 Stable and reliable FinFET SRAM with improved beta ratio Lei Zhuang, Ananthan Raghunathan 2017-10-24
9576646 SRAM cell with dynamic split ground and split wordline 2017-02-21