Issued Patents All Time
Showing 1–25 of 68 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10628544 | Optimizing integrated circuit designs based on interactions between multiple integration design rules | Dureseti Chidambarrao, Dongbing Shao, Steven Zebertavage | 2020-04-21 |
| 10592627 | Optimizing integrated circuit designs based on interactions between multiple integration design rules | Dureseti Chidambarrao, Dongbing Shao, Steven Zebertavage | 2020-03-17 |
| 10083272 | Integrated circuit design layout optimizer based on process variation and failure mechanism | Lawrence A. Clevenger, Dongbing Shao, Robert C. Wong | 2018-09-25 |
| 9741706 | Immunity to inline charging damage in circuit designs | Zachary Henderson, Terence B. Hook, Nicholas Palmer, Kirk D. Peterson | 2017-08-22 |
| 9741707 | Immunity to inline charging damage in circuit designs | Zachary Henderson, Terence B. Hook, Nicholas Palmer, Kirk D. Peterson | 2017-08-22 |
| 9646125 | Method for conversion of commercial microprocessor to radiation-hardened processor and resulting processor | John A. Fifield, Mark C. Hakey, James S. Nakos, Tak H. Ning, Kenneth P. Rodbell +3 more | 2017-05-09 |
| 9612612 | Tunable sector buffer for wide bandwidth resonant global clock distribution | Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Yong-im Kim, Liang Pang +3 more | 2017-04-04 |
| 9378329 | Immunity to inline charging damage in circuit designs | Zachary Henderson, Terence B. Hook, Nicholas Palmer, Kirk D. Peterson | 2016-06-28 |
| 9268886 | Setting switch size and transition pattern in a resonant clock distribution system | William Robert Reohr, Phillip J. Restle | 2016-02-23 |
| 9058130 | Tunable sector buffer for wide bandwidth resonant global clock distribution | Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Yong-im Kim, Liang Pang +3 more | 2015-06-16 |
| 9054682 | Wide bandwidth resonant global clock distribution | Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Yong-im Kim, Liang Pang +3 more | 2015-06-09 |
| 8997028 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Anda C. Mocuta | 2015-03-31 |
| 8887118 | Setting switch size and transition pattern in a resonant clock distribution system | William Robert Reohr, Phillip J. Restle | 2014-11-11 |
| 8850373 | Setting switch size and transition pattern in a resonant clock distribution system | William Robert Reohr, Phillip J. Restle | 2014-09-30 |
| 8736342 | Changing resonant clock modes | Thomas J. Bucelot, Alan J. Drake, Joshua D. Friedrich, Liang Pang, William Robert Reohr +3 more | 2014-05-27 |
| 8704576 | Variable resistance switch for wide bandwidth resonant global clock distribution | Thomas J. Bucelot, Alan J. Drake, Robert A. Groves, Yong-im Kim, Liang Pang +3 more | 2014-04-22 |
| 8464189 | Technology migration for integrated circuits with radical design restrictions | Robert J. Allen, Cam V. Endicott, Fook-Luen Heng, Kevin W. McCullen, Rani Narayan +2 more | 2013-06-11 |
| 8429576 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Anda C. Mocuta | 2013-04-23 |
| 8423328 | Method of distributing a random variable using statistically correct spatial interpolation continuously with spatially inhomogeneous statistical correlation versus distance, standard deviation, and mean | John M. Cohn, Ulrich A. Finkler, David J. Hathaway, Jeffrey G. Hemmett, Fook-Luen Heng +3 more | 2013-04-16 |
| 8418090 | Method for computing the sensitivity of a VLSI design to both random and systematic defects using a critical area analysis tool | Jeanne P. Bickford, Juergen Koehl | 2013-04-09 |
| 8405751 | Image sensor pixel structure employing a shared floating diffusion | Daniel N. Maynard, Kevin N. Ogg, Richard J. Rassel | 2013-03-26 |
| 8239790 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Anda C. Mocuta | 2012-08-07 |
| 8234594 | Redundant micro-loop structure for use in an integrated circuit physical design process and method of forming the same | Brent A. Anderson, Jeanne P. Bickford, Markus Buehler, Juergen Koehl, Edward J. Nowak | 2012-07-31 |
| 8230378 | Method for IC wiring yield optimization, including wire widening during and after routing | John M. Cohn, Gustavo E. Tellez | 2012-07-24 |
| 8141027 | Automated sensitivity definition and calibration for design for manufacturing tools | James A. Culp, Lars Liebmann, Tina Wagner | 2012-03-20 |