Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8704325 | Pixel sensors of multiple pixel size and methods of implant dose control | John J. Ellis-Monaghan, Jeffery P. GAMBINO, Richard J. Rassel | 2014-04-22 |
| 8405751 | Image sensor pixel structure employing a shared floating diffusion | Jason D. Hibbeler, Kevin N. Ogg, Richard J. Rassel | 2013-03-26 |
| 8334195 | Pixel sensors of multiple pixel size and methods of implant dose control | John J. Ellis-Monaghan, Jeffrey P. Gambino, Richard J. Rassel | 2012-12-18 |
| 8201132 | System and method for testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, William C. Leipold, Michael E. Scaman, Shi Zhong | 2012-06-12 |
| 8136066 | Apparatus and computer program product for semiconductor yield estimation | Jeanne P. Bickford, Jason D. Hibbeler, Juergen Koehl, William J. Livingstone | 2012-03-13 |
| 7893468 | Optical sensor including stacked photodiodes | Jeffrey P. Gambino, Kevin N. Ogg, Richard J. Rassel, Raymond J. Rosner | 2011-02-22 |
| 7883916 | Optical sensor including stacked photosensitive diodes | Jeffrey P. Gambino, Kevin N. Ogg, Richard J. Rassel, Raymond J. Rosner | 2011-02-08 |
| 7818694 | IC layout optimization to improve yield | Robert J. Allen, Faye D. Baker, Albert M. Chu, Michael S. Gray, Jason D. Hibbeler +2 more | 2010-10-19 |
| 7752580 | Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique | Sarah C. Braasch, Jason D. Hibbeler, Rouwaida N. Kanj, Sani R. Nassif, Evanthia Papadopoulou | 2010-07-06 |
| 7752589 | Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design | Robert J. Allen, Sarah C. Braasch, Matthew T. Guzowski, Jason D. Hibbeler, Kevin W. McCullen +3 more | 2010-07-06 |
| 7703061 | IC design modeling allowing dimension-dependent rule checking | Evanthia Papadopoulou | 2010-04-20 |
| 7685544 | Testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, William C. Leipold, Michael E. Scaman, Shi Zhong | 2010-03-23 |
| 7661081 | Content based yield prediction of VLSI designs | Robert J. Allen, Daria R. Dooling, Jason D. Hibbeler, Sarah C. Prue, Ralph J. Williams | 2010-02-09 |
| 7584077 | Physical design characterization system | Betty L. Bergman Reuter, Mitchell R. DeHond, William C. Leipold, Brian D. Pfeifer, David C. Reynolds +1 more | 2009-09-01 |
| 7577927 | IC design modeling allowing dimension-dependent rule checking | Evanthia Papadopoulou | 2009-08-18 |
| 7555735 | IC design modeling allowing dimension-dependent rule checking | Evanthia Papadopoulou | 2009-06-30 |
| 7552417 | System for search and analysis of systematic defects in integrated circuits | Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee | 2009-06-23 |
| 7503020 | IC layout optimization to improve yield | Robert J. Allen, Faye D. Baker, Albert M. Chu, Michael S. Gray, Jason D. Hibbeler +2 more | 2009-03-10 |
| 7415695 | System for search and analysis of systematic defects in integrated circuits | Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee | 2008-08-19 |
| 7404164 | IC design modeling allowing dimension-dependent rule checking | Evanthia Papadopoulou | 2008-07-22 |
| 7404174 | method for generating a set of test patterns for an optical proximity correction algorithm | David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee | 2008-07-22 |
| 7398485 | Yield optimization in router for systematic defects | Jeanne P. Bickford, Markus Buehler, Jason D. Hibbeler, Juergen Koehl | 2008-07-08 |
| 7389480 | Content based yield prediction of VLSI designs | Robert J. Allen, Daria R. Dooling, Jason D. Hibbeler, Sarah C. Prue, Ralph J. Williams | 2008-06-17 |
| 7353472 | System and method for testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, William C. Leipold, Michael E. Scaman, Shi Zhong | 2008-04-01 |
| 7284230 | System for search and analysis of systematic defects in integrated circuits | Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee | 2007-10-16 |