| 8704325 |
Pixel sensors of multiple pixel size and methods of implant dose control |
John J. Ellis-Monaghan, Jeffery P. GAMBINO, Richard J. Rassel |
2014-04-22 |
$7,961,000 |
| 8405751 |
Image sensor pixel structure employing a shared floating diffusion |
Jason D. Hibbeler, Kevin N. Ogg, Richard J. Rassel |
2013-03-26 |
$5,395,000 |
| 8334195 |
Pixel sensors of multiple pixel size and methods of implant dose control |
John J. Ellis-Monaghan, Jeffrey P. Gambino, Richard J. Rassel |
2012-12-18 |
$19,488,000 |
| 8201132 |
System and method for testing pattern sensitive algorithms for semiconductor design |
David L. DeMaris, Timothy G. Dunham, William C. Leipold, Michael E. Scaman, Shi Zhong |
2012-06-12 |
$5,600,000 |
| 8136066 |
Apparatus and computer program product for semiconductor yield estimation |
Jeanne P. Bickford, Jason D. Hibbeler, Juergen Koehl, William J. Livingstone |
2012-03-13 |
$7,610,000 |
| 7893468 |
Optical sensor including stacked photodiodes |
Jeffrey P. Gambino, Kevin N. Ogg, Richard J. Rassel, Raymond J. Rosner |
2011-02-22 |
$3,876,000 |
| 7883916 |
Optical sensor including stacked photosensitive diodes |
Jeffrey P. Gambino, Kevin N. Ogg, Richard J. Rassel, Raymond J. Rosner |
2011-02-08 |
$4,016,000 |
| 7818694 |
IC layout optimization to improve yield |
Robert J. Allen, Faye D. Baker, Albert M. Chu, Michael S. Gray, Jason D. Hibbeler +2 more |
2010-10-19 |
$3,706,000 |
| 7752580 |
Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique |
Sarah C. Braasch, Jason D. Hibbeler, Rouwaida N. Kanj, Sani R. Nassif, Evanthia Papadopoulou |
2010-07-06 |
$3,063,000 |
| 7752589 |
Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design |
Robert J. Allen, Sarah C. Braasch, Matthew T. Guzowski, Jason D. Hibbeler, Kevin W. McCullen +3 more |
2010-07-06 |
$3,063,000 |
| 7703061 |
IC design modeling allowing dimension-dependent rule checking |
Evanthia Papadopoulou |
2010-04-20 |
$4,962,000 |
| 7685544 |
Testing pattern sensitive algorithms for semiconductor design |
David L. DeMaris, Timothy G. Dunham, William C. Leipold, Michael E. Scaman, Shi Zhong |
2010-03-23 |
$4,775,000 |
| 7661081 |
Content based yield prediction of VLSI designs |
Robert J. Allen, Daria R. Dooling, Jason D. Hibbeler, Sarah C. Prue, Ralph J. Williams |
2010-02-09 |
$5,437,000 |
| 7584077 |
Physical design characterization system |
Betty L. Bergman Reuter, Mitchell R. DeHond, William C. Leipold, Brian D. Pfeifer, David C. Reynolds +1 more |
2009-09-01 |
$20,741,000 |
| 7577927 |
IC design modeling allowing dimension-dependent rule checking |
Evanthia Papadopoulou |
2009-08-18 |
$24,774,000 |
| 7555735 |
IC design modeling allowing dimension-dependent rule checking |
Evanthia Papadopoulou |
2009-06-30 |
$31,543,000 |
| 7552417 |
System for search and analysis of systematic defects in integrated circuits |
Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee |
2009-06-23 |
$5,277,000 |
| 7503020 |
IC layout optimization to improve yield |
Robert J. Allen, Faye D. Baker, Albert M. Chu, Michael S. Gray, Jason D. Hibbeler +2 more |
2009-03-10 |
$6,331,000 |
| 7415695 |
System for search and analysis of systematic defects in integrated circuits |
Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee |
2008-08-19 |
$14,278,000 |
| 7404164 |
IC design modeling allowing dimension-dependent rule checking |
Evanthia Papadopoulou |
2008-07-22 |
$9,818,000 |
| 7404174 |
method for generating a set of test patterns for an optical proximity correction algorithm |
David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee |
2008-07-22 |
$9,818,000 |
| 7398485 |
Yield optimization in router for systematic defects |
Jeanne P. Bickford, Markus Buehler, Jason D. Hibbeler, Juergen Koehl |
2008-07-08 |
$9,414,000 |
| 7389480 |
Content based yield prediction of VLSI designs |
Robert J. Allen, Daria R. Dooling, Jason D. Hibbeler, Sarah C. Prue, Ralph J. Williams |
2008-06-17 |
$10,894,000 |
| 7353472 |
System and method for testing pattern sensitive algorithms for semiconductor design |
David L. DeMaris, Timothy G. Dunham, William C. Leipold, Michael E. Scaman, Shi Zhong |
2008-04-01 |
$7,825,000 |
| 7284230 |
System for search and analysis of systematic defects in integrated circuits |
Bette L. Bergman Reuter, David L. DeMaris, Mark A. Lavin, William C. Leipold, Maharaj Mukherjee |
2007-10-16 |
$5,691,000 |
