Michael E. Scaman — 22 Patents at IBM

Michael E. Scaman has been granted 22 US patents while listed as an inventor at IBM. The first was granted in 1995 and the most recent in June 2012. Michael E. Scaman ranks #189,202 of 4,157,543 US inventors in our database (top 4.6%). Patent records list Michael E. Scaman in Peekskill, NY, US.

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8201132	System and method for testing pattern sensitive algorithms for semiconductor design	David L. DeMaris, Timothy G. Dunham, William C. Leipold, Daniel N. Maynard, Shi Zhong	2012-06-12	$5,600,000
8174681	Calibration of lithographic process models	Ioana Graur, Geng Han, Scott M. Mansfield	2012-05-08	$8,171,000
8161421	Calibration and verification structures for use in optical proximity correction	Ramya Viswanathan, Amr Y. Abdo, Henning Haffner, Oseo Park	2012-04-17	$5,847,000
7975246	MEEF reduction by elongation of square shapes	Derren N. Dunn, Michael M. Crouse, Henning Haffner	2011-07-05	$9,300,000
7808257	Ionization test for electrical verification	Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more	2010-10-05	$4,341,000
7685544	Testing pattern sensitive algorithms for semiconductor design	David L. DeMaris, Timothy G. Dunham, William C. Leipold, Daniel N. Maynard, Shi Zhong	2010-03-23	$4,775,000
7673279	Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC)	—	2010-03-02	$8,802,000
7360199	Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC)	—	2008-04-15	$8,007,000
7353472	System and method for testing pattern sensitive algorithms for semiconductor design	David L. DeMaris, Timothy G. Dunham, William C. Leipold, Daniel N. Maynard, Shi Zhong	2008-04-01	$7,825,000
7187179	Wiring test structures for determining open and short circuits in semiconductor devices	Toshiaki Yanagisawa	2007-03-06	$6,019,000
6800864	Method and structure for reducing effects of noise and resonance associated with an e-beam lithography tool	—	2004-10-05	$8,713,000
6785615	Method and structure for detection of electromechanical problems using variance statistics in an E-beam lithography device	—	2004-08-31	$4,873,000
6781141	Method and structure for detection and measurement of electrical and mechanical resonance associated with an E-beam lithography tool	—	2004-08-24	$9,549,000
6400128	Thermal modulation system and method for locating a circuit defect	Daniel Guidotti, Arnold Halperin, Arthur R. Zingher	2002-06-04	$11,648,000
6242923	Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards	Edward J. Yarmchuk, Arnold Halperin	2001-06-05	$46,299,000
6236196	Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry	Daniel Guidotti, Arnold Halperin, Arthur R. Zingher	2001-05-22	$28,959,000
6141093	Method and apparatus for locating power plane shorts using polarized light microscopy	Bernell E. Argyle, Arnold Halperin, Edward J. Yarmchuk	2000-10-31	$31,312,000
6005966	Method and apparatus for multi-stream detection of high density metalization layers of multilayer structures having low contrast	—	1999-12-21	$22,815,000
5936408	Simplified contactless test of MCM thin film I/O nets using a plasma	—	1999-08-10	$20,467,000
5821759	Method and apparatus for detecting shorts in a multi-layer electronic package	Edward J. Yarmchuk, Yuet-Ying Yu	1998-10-13	$13,371,000
5818239	Simplified contactless test of MCM thin film I/O nets using a plasma	—	1998-10-06	$15,994,000
5448650	Thin-film latent open optical detection with template-based feature extraction	Kamalesh S. Desai, James Wood	1995-09-05	$5,794,000

Michael E. Scaman — 22 Patents

Issued Patents All Time

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