Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8201132 | System and method for testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, William C. Leipold, Daniel N. Maynard, Shi Zhong | 2012-06-12 |
| 8174681 | Calibration of lithographic process models | Ioana Graur, Geng Han, Scott M. Mansfield | 2012-05-08 |
| 8161421 | Calibration and verification structures for use in optical proximity correction | Ramya Viswanathan, Amr Y. Abdo, Henning Haffner, Oseo Park | 2012-04-17 |
| 7975246 | MEEF reduction by elongation of square shapes | Derren N. Dunn, Michael M. Crouse, Henning Haffner | 2011-07-05 |
| 7808257 | Ionization test for electrical verification | Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more | 2010-10-05 |
| 7685544 | Testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, William C. Leipold, Daniel N. Maynard, Shi Zhong | 2010-03-23 |
| 7673279 | Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC) | — | 2010-03-02 |
| 7360199 | Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC) | — | 2008-04-15 |
| 7353472 | System and method for testing pattern sensitive algorithms for semiconductor design | David L. DeMaris, Timothy G. Dunham, William C. Leipold, Daniel N. Maynard, Shi Zhong | 2008-04-01 |
| 7187179 | Wiring test structures for determining open and short circuits in semiconductor devices | Toshiaki Yanagisawa | 2007-03-06 |
| 6800864 | Method and structure for reducing effects of noise and resonance associated with an e-beam lithography tool | — | 2004-10-05 |
| 6785615 | Method and structure for detection of electromechanical problems using variance statistics in an E-beam lithography device | — | 2004-08-31 |
| 6781141 | Method and structure for detection and measurement of electrical and mechanical resonance associated with an E-beam lithography tool | — | 2004-08-24 |
| 6400128 | Thermal modulation system and method for locating a circuit defect | Daniel Guidotti, Arnold Halperin, Arthur R. Zingher | 2002-06-04 |
| 6242923 | Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards | Edward J. Yarmchuk, Arnold Halperin | 2001-06-05 |
| 6236196 | Thermal modulation system and method for locating a circuit defect such as a short or incipient open independent of a circuit geometry | Daniel Guidotti, Arnold Halperin, Arthur R. Zingher | 2001-05-22 |
| 6141093 | Method and apparatus for locating power plane shorts using polarized light microscopy | Bernell E. Argyle, Arnold Halperin, Edward J. Yarmchuk | 2000-10-31 |
| 6005966 | Method and apparatus for multi-stream detection of high density metalization layers of multilayer structures having low contrast | — | 1999-12-21 |
| 5936408 | Simplified contactless test of MCM thin film I/O nets using a plasma | — | 1999-08-10 |
| 5821759 | Method and apparatus for detecting shorts in a multi-layer electronic package | Edward J. Yarmchuk, Yuet-Ying Yu | 1998-10-13 |
| 5818239 | Simplified contactless test of MCM thin film I/O nets using a plasma | — | 1998-10-06 |
| 5448650 | Thin-film latent open optical detection with template-based feature extraction | Kamalesh S. Desai, James Wood | 1995-09-05 |