YY

Yuet-Ying Yu

IBM: 20 patents #5,451 of 70,183Top 8%
GE: 7 patents #4,929 of 36,430Top 15%
Overall (All Time): #143,994 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
12028997 Rotating lid for module cooler Noah Singer, Jeffrey A. Zitz, Mark D. Schultz, John G. Torok, William L. Brodsky +1 more 2024-07-02
11800666 Temporary removable module lid Noah Singer, Jeffrey A. Zitz, Mark D. Schultz, John G. Torok, William L. Brodsky +1 more 2023-10-24
10834860 Method of mounting a module to a land grid array (LGA) Ryan Elsasser, Brian E. Hanrahan, Steven J. James, Oswald J. Mantilla, Enrico A. Romano 2020-11-10
10756009 Efficient placement of grid array components Mark K. Hoffmeyer, Brian S. Beaman, Theron Lee Lewis 2020-08-25
10537050 Module installation alignment device Ryan Elsasser, Brian E. Hanrahan, Steven J. James, Oswald J. Mantilla, Enrico A. Romano 2020-01-14
10109975 Module placement apparatus Jason R. Eagle, Roger Duane Hamilton, Brian E. Hanrahan, Robert K. Mullady, Enrico A. Romano 2018-10-23
8267701 Alignment structure having a frame structure and bridging connections to couple and align segments of a socket housing Brian S. Beaman, William L. Brodsky, John L. Colbert, Mark K. Hoffmeyer 2012-09-18
7118385 Apparatus for implementing a self-centering land grid array socket Paul F. Bodenweber, David C. Long, Jason S. Miller, Robert P. Westerfield, Jr. 2006-10-10
6984997 Method and system for testing multi-chip integrated circuit modules Paul F. Bodenweber, Charles J. Hendricks, Frank C. Seelmann 2006-01-10
6627052 Electroplating apparatus with vertical electrical contact James E. Fluegel, Peter S. Locke 2003-09-30
6529021 Self-scrub buckling beam probe Daniel G. Berger, Camille P. Bowne, Scott I. Langenthal, Charles H. Perry, Terence W. Spoor +1 more 2003-03-04
6504388 Electrical test tool having easily replaceable electrical probe Ralph R. Comulada, Jr., Michael P. Goldowsky, John P. Karidis, Gerard McVicker 2003-01-07
6429672 Contamination-tolerant electrical test probe Robert N. Wiggin 2002-08-06
6404211 Metal buckling beam probe Harvey C. Hamel, Charles H. Perry 2002-06-11
6281692 Interposer for maintaining temporary contact between a substrate and a test bed Paul F. Bodenweber, Ralph R. Comulada, Jr., Mukta S. Farooq, Charles J. Hendricks, Philo B. Hodge +3 more 2001-08-28
6252414 Method and apparatus for testing circuits having different configurations with a single test fixture James Boyette, Jiann-Chang Lo 2001-06-26
6127832 Electrical test tool having easily replaceable electrical probe Ralph R. Comulada, Jr., Michael P. Goldowsky, John P. Karidis, Gerard McVicker 2000-10-03
5900316 Flexible conductive sheet 1999-05-04
5898311 Shorting pad having a flexible conductive sheet Paul F. Bodenweber, Robert Charles Polacco 1999-04-27
5821759 Method and apparatus for detecting shorts in a multi-layer electronic package Michael E. Scaman, Edward J. Yarmchuk 1998-10-13
4970481 Current limiting circuit breaker contact arm configuration David Arnold 1990-11-13
4963849 Compact current limiting circuit breaker Karen B. Kowalczyk, David Arnold, Roger N. Castonguay 1990-10-16
4831221 Molded case circuit breaker auxiliary switch unit Robert A. Morris, Paul T. Rajotte, Lee A. Wambolt 1989-05-16
4803774 Method of making molded case circuit breaker contact arrangement Robert A. Morris, James M. Mitsch, Irenaeus S. Panus, Roger N. Castonguay 1989-02-14
4801906 Molded case circuit breaker trip indicator unit Robert A. Morris 1989-01-31