| 7808257 |
Ionization test for electrical verification |
Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more |
2010-10-05 |
| 7294909 |
Electronic package repair process |
Jon A. Casey, James G. Balz, Michael Berger, Jerome D. Cohen, Richard F. Indyk +13 more |
2007-11-13 |
| 6984997 |
Method and system for testing multi-chip integrated circuit modules |
Yuet-Ying Yu, Paul F. Bodenweber, Frank C. Seelmann |
2006-01-10 |
| 6916670 |
Electronic package repair process |
Jon A. Casey, James G. Balz, Michael Berger, Jerome D. Cohen, Richard F. Indyk +13 more |
2005-07-12 |
| 6753688 |
Interconnect package cluster probe short removal apparatus and method |
Roger M. Eddy, Thomas Morrison, Robert N. Wiggin, Brian J. Wojszynski |
2004-06-22 |
| 6281692 |
Interposer for maintaining temporary contact between a substrate and a test bed |
Paul F. Bodenweber, Ralph R. Comulada, Jr., Mukta S. Farooq, Philo B. Hodge, Vincent P. Peterson +3 more |
2001-08-28 |
| 6235544 |
Seed metal delete process for thin film repair solutions using direct UV laser |
Peter A. Franklin, Richard P. Surprenant, Stephen J. Tirch, III, Thomas A. Wassick, James Wood |
2001-05-22 |
| 6054863 |
System for testing circuit board integrity |
Thomas Morrison, Siegfried Geyer, Klaus Probst |
2000-04-25 |
| 5904868 |
Mounting and/or removing of components using optical fiber tools |
Laertis Economikos, Robert Hannon, Richard P. Surprenant |
1999-05-18 |
| 4600464 |
Plasma etching reactor with reduced plasma potential |
Brian H. Desilets, Thomas Günther, John H. Keller |
1986-07-15 |
| 4534816 |
Single wafer plasma etch reactor |
Lee Chen, Gangadhara S. Mathad, Stanley J. Poloncic |
1985-08-13 |
| 4340461 |
Modified RIE chamber for uniform silicon etching |
William W. Hicks, John H. Keller |
1982-07-20 |
