Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7808257 | Ionization test for electrical verification | Christopher Cline, Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko +4 more | 2010-10-05 |
| 7294909 | Electronic package repair process | Jon A. Casey, James G. Balz, Michael Berger, Jerome D. Cohen, Richard F. Indyk +13 more | 2007-11-13 |
| 6984997 | Method and system for testing multi-chip integrated circuit modules | Yuet-Ying Yu, Paul F. Bodenweber, Frank C. Seelmann | 2006-01-10 |
| 6916670 | Electronic package repair process | Jon A. Casey, James G. Balz, Michael Berger, Jerome D. Cohen, Richard F. Indyk +13 more | 2005-07-12 |
| 6753688 | Interconnect package cluster probe short removal apparatus and method | Roger M. Eddy, Thomas Morrison, Robert N. Wiggin, Brian J. Wojszynski | 2004-06-22 |
| 6281692 | Interposer for maintaining temporary contact between a substrate and a test bed | Paul F. Bodenweber, Ralph R. Comulada, Jr., Mukta S. Farooq, Philo B. Hodge, Vincent P. Peterson +3 more | 2001-08-28 |
| 6235544 | Seed metal delete process for thin film repair solutions using direct UV laser | Peter A. Franklin, Richard P. Surprenant, Stephen J. Tirch, III, Thomas A. Wassick, James Wood | 2001-05-22 |
| 6054863 | System for testing circuit board integrity | Thomas Morrison, Siegfried Geyer, Klaus Probst | 2000-04-25 |
| 5904868 | Mounting and/or removing of components using optical fiber tools | Laertis Economikos, Robert Hannon, Richard P. Surprenant | 1999-05-18 |
| 4600464 | Plasma etching reactor with reduced plasma potential | Brian H. Desilets, Thomas Günther, John H. Keller | 1986-07-15 |
| 4534816 | Single wafer plasma etch reactor | Lee Chen, Gangadhara S. Mathad, Stanley J. Poloncic | 1985-08-13 |
| 4340461 | Modified RIE chamber for uniform silicon etching | William W. Hicks, John H. Keller | 1982-07-20 |