Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6984997 | Method and system for testing multi-chip integrated circuit modules | Yuet-Ying Yu, Paul F. Bodenweber, Charles J. Hendricks | 2006-01-10 |
FS
Frank C. Seelmann
Overall (All Time): #3,405,132 of 4,157,543Top 85%
1
Patents All Time