Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7808257 | Ionization test for electrical verification | Edward J. Yarmchuk, Vincent A. Arena, Donald A. Merte, Thomas Picunko, Brian J. Wojszynski +4 more | 2010-10-05 | $4,341,000 |
| 6323045 | Method and structure for top-to-bottom I/O nets repair in a thin film transfer and join process | Nancy Wagner Hannon, Chandrika Prasad, Thomas A. Wassick, Roy Yu | 2001-11-27 | $23,652,000 |