Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12469124 | Machine learning based yield prediction | Boris Levant, Noam Tal, Ran YACOBY, Lilach Choona, Shaul Pres +2 more | 2025-11-11 |
| 12223641 | Defect detection of a semiconductor specimen | Boaz Dudovich, Amir Bar, Lior Yehieli, Chen Itzikowitz, Shiran Ben Israel +3 more | 2025-02-11 |