BL

Boris Levant

LC Landa Corporation: 3 patents #43 of 84Top 55%
NI Nova Measuring Instruments: 2 patents #43 of 108Top 40%
NO Nova: 1 patents #39 of 75Top 55%
Overall (All Time): #773,345 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
12214601 Detecting a defective nozzle in a digital printing system Shai Silberstein, Tomer Yanir, Avraham Guttman, Alon Siman Tov 2025-02-04
11630618 Correcting registration errors in digital printing 2023-04-18
11366398 Time-domain optical metrology and inspection of semiconductor devices Gilad Barak, Michael Chemama, Smadar Ferber, Yanir Hainick, Ze'ev Lindenfeld +3 more 2022-06-21
11321028 Correcting registration errors in digital printing 2022-05-03
10761036 Method and system for optical metrology in patterned structures Yanir Hainick, Vladimir Machavariani, Roy Koret, Gilad Barak 2020-09-01
10274435 Method and system for optical metrology in patterned structures Yanir Hainick, Vladimir Machavariani, Roy Koret, Gilad Barak 2019-04-30