Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066385 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Yonatan Oren | 2024-08-20 |
| 11710616 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2023-07-25 |
| 11450541 | Metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-09-20 |
| 11309162 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-04-19 |
| 11275027 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Yonatan Oren | 2022-03-15 |
| 10916404 | TEM-based metrology method and system | Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2021-02-09 |
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Roy Koret, Gilad Barak | 2020-09-01 |
| 10564106 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Yonatan Oren | 2020-02-18 |
| 10274435 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Roy Koret, Gilad Barak | 2019-04-30 |
| 7187456 | Method and apparatus for measurements of patterned structures | David Scheiner | 2007-03-06 |
| 7123366 | Method and apparatus for measurements of patterned structures | David Scheiner | 2006-10-17 |
| 6885446 | Method and system for monitoring a process of material removal from the surface of a patterned structure | David Scheiner, Amit Weingarten, Avi Ravid | 2005-04-26 |
| 6836324 | Method and apparatus for measurements of patterned structures | David Scheiner | 2004-12-28 |
| 6654108 | Test structure for metal CMP process control | Avi Ravid, Amit Weingarten | 2003-11-25 |
| 6476920 | Method and apparatus for measurements of patterned structures | David Scheiner | 2002-11-05 |