Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11710616 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Igor Ziselman, Ronen Urenski +1 more | 2023-07-25 |
| 11450541 | Metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Igor Ziselman, Ronen Urenski +1 more | 2022-09-20 |
| 11309162 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Igor Ziselman, Ronen Urenski +1 more | 2022-04-19 |
| 10916404 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Igor Ziselman, Ronen Urenski +1 more | 2021-02-09 |