Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12057355 | Semiconductor device manufacture with in-line hotspot detection | Avron Ger | 2024-08-06 | |
| 11710616 | TEM-based metrology method and system | Vladimir Machavariani, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2023-07-25 | |
| 11450541 | Metrology method and system | Vladimir Machavariani, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-09-20 | |
| 11309162 | TEM-based metrology method and system | Vladimir Machavariani, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2022-04-19 | |
| 10916404 | TEM-based metrology method and system | Vladimir Machavariani, Daniel Kandel, Victor Kucherov, Igor Ziselman, Ronen Urenski +1 more | 2021-02-09 | $17,692,000 |
| 7803715 | Lithographic patterning for sub-90nm with a multi-layered carbon-based hardmask | Shai Haimson, Gabe Schwartz | 2010-09-28 |