Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11710616 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman +1 more | 2023-07-25 |
| 11450541 | Metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman +1 more | 2022-09-20 |
| 11309162 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman +1 more | 2022-04-19 |
| 10916404 | TEM-based metrology method and system | Vladimir Machavariani, Michael Shifrin, Daniel Kandel, Victor Kucherov, Igor Ziselman +1 more | 2021-02-09 |
| 7151257 | Tailoring domain engineered structures in ferroelectric materials | Gil Rosenman, Yossi Rosenwaks | 2006-12-19 |
| 6653630 | Tailoring domain engineered structures in ferroelectric materials | Gil Rosenman, Yossi Rosenwaks | 2003-11-25 |