Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12343791 | Additive metal casting system and apparatus | Gil Lavi, Emil Weisz | 2025-07-01 |
| 12053817 | Sand molding for metal additive casting | Emil Weisz, Shimon Sandik | 2024-08-06 |
| 11849207 | Inspection system for use in monitoring plants in plant growth areas | Eilat TAL, Hai Benron | 2023-12-19 |
| 11766715 | Sand molding for metal additive casting | Emil Weisz, Shimon Sandik | 2023-09-26 |
| 11601587 | System and method for monitoring plants in plant growing areas | Eilat TAL, Hai Benron | 2023-03-07 |
| 11483471 | Inspection system for use in monitoring plants in plant growth areas | Eilat TAL, Hai Benron | 2022-10-25 |
| 10316419 | System for utilizing excess heat for carrying out electrochemical reactions | Roi Harpaz | 2019-06-11 |
| 10072344 | Device and apparatus for carrying out chemical dissociation reactions at elevated temperatures | Jacob Karni, Raymond A. George, Gabriel Seiden | 2018-09-11 |
| 9785059 | Lateral shift measurement using an optical technique | Boaz Brill, Moshe Finarov | 2017-10-10 |
| 9140539 | Optical system and method for measurement of one or more parameters of via-holes | — | 2015-09-22 |
| 8531679 | Optical system and method for measurement of one or more parameters of via-holes | — | 2013-09-10 |
| 7532414 | Reflective optical system | Michael Winik, Yakov Lyubchik | 2009-05-12 |
| 7292341 | Optical system operating with variable angle of incidence | Boaz Brill, Moshe Finarov | 2007-11-06 |
| 7253970 | Reflective optical system | Michael Winik, Yakov Lyubchik | 2007-08-07 |
| 7187456 | Method and apparatus for measurements of patterned structures | Vladimir Machavariani | 2007-03-06 |
| 7123366 | Method and apparatus for measurements of patterned structures | Vladimir Machavariani | 2006-10-17 |
| 6974962 | Lateral shift measurement using an optical technique | Boaz Brill, Moshe Finarov | 2005-12-13 |
| 6940609 | Method and system for measuring the topography of a sample | — | 2005-09-06 |
| 6885446 | Method and system for monitoring a process of material removal from the surface of a patterned structure | Vladimir Machavariani, Amit Weingarten, Avi Ravid | 2005-04-26 |
| 6836324 | Method and apparatus for measurements of patterned structures | Vladimir Machavariani | 2004-12-28 |
| 6815947 | Method and system for thickness measurements of thin conductive layers | Yoav Many, Rahamin Guliamov, Shahar Gov | 2004-11-09 |
| 6801315 | Method and system for overlay measurement | Moshe Finarov | 2004-10-05 |
| 6801326 | Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects | Moshe Finarov, Avi Ravid | 2004-10-05 |
| 6556947 | Optical measurements of patterned structures | Avi Ravid | 2003-04-29 |
| 6476920 | Method and apparatus for measurements of patterned structures | Vladimir Machavariani | 2002-11-05 |