David Scheiner — 31 Patents at Nova Measuring Instruments

David Scheiner has been granted 31 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 1985 and the most recent in December 2025. David Scheiner ranks #115,823 of 4,157,543 US inventors in our database (top 2.8%). Patent records list David Scheiner in Savyon, IL, IL.

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12484466	Systems and methods for monitoring plants in plant growing areas	Eilat TAL, Hai Benron	2025-12-02
12445709	Inspection system for use in monitoring plants in plant growth areas	Eilat TAL, Hai Benron	2025-10-14
12343791	Additive metal casting system and apparatus	Gil Lavi, Emil Weisz	2025-07-01
12053817	Sand molding for metal additive casting	Emil Weisz, Shimon Sandik	2024-08-06
11849207	Inspection system for use in monitoring plants in plant growth areas	Eilat TAL, Hai Benron	2023-12-19
11766715	Sand molding for metal additive casting	Emil Weisz, Shimon Sandik	2023-09-26
11601587	System and method for monitoring plants in plant growing areas	Eilat TAL, Hai Benron	2023-03-07
11483471	Inspection system for use in monitoring plants in plant growth areas	Eilat TAL, Hai Benron	2022-10-25
10316419	System for utilizing excess heat for carrying out electrochemical reactions	Roi Harpaz	2019-06-11
10072344	Device and apparatus for carrying out chemical dissociation reactions at elevated temperatures	Jacob Karni, Raymond A. George, Gabriel Seiden	2018-09-11
9785059	Lateral shift measurement using an optical technique	Boaz Brill, Moshe Finarov	2017-10-10	$8,363,000
9140539	Optical system and method for measurement of one or more parameters of via-holes	—	2015-09-22	$716,000
8531679	Optical system and method for measurement of one or more parameters of via-holes	—	2013-09-10	$704,000
7532414	Reflective optical system	Michael Winik, Yakov Lyubchik	2009-05-12	$922,000
7292341	Optical system operating with variable angle of incidence	Boaz Brill, Moshe Finarov	2007-11-06	$245,000
7253970	Reflective optical system	Michael Winik, Yakov Lyubchik	2007-08-07	$516,000
7187456	Method and apparatus for measurements of patterned structures	Vladimir Machavariani	2007-03-06	$603,000
7123366	Method and apparatus for measurements of patterned structures	Vladimir Machavariani	2006-10-17	$274,000
6974962	Lateral shift measurement using an optical technique	Boaz Brill, Moshe Finarov	2005-12-13	$455,000
6940609	Method and system for measuring the topography of a sample	—	2005-09-06	$446,000
6885446	Method and system for monitoring a process of material removal from the surface of a patterned structure	Vladimir Machavariani, Amit Weingarten, Avi Ravid	2005-04-26	$456,000
6836324	Method and apparatus for measurements of patterned structures	Vladimir Machavariani	2004-12-28	$729,000
6815947	Method and system for thickness measurements of thin conductive layers	Yoav Many, Rahamin Guliamov, Shahar Gov	2004-11-09	$859,000
6801326	Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects	Moshe Finarov, Avi Ravid	2004-10-05	$470,000
6801315	Method and system for overlay measurement	Moshe Finarov	2004-10-05	$470,000

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David Scheiner — 31 Patents

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