Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for measuring the topography of a sample

Method and system for measuring the topography of a sample

US Patent 6940609 · Granted Sep 6, 2005

Estimated economic value: $446,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for monitoring plants in plant growing areas2025
Inspection system for use in monitoring plants in plant growth areas2025
Additive metal casting system and apparatus2025
Sand molding for metal additive casting2024
Inspection system for use in monitoring plants in plant growth areas2023
Sand molding for metal additive casting2023
System and method for monitoring plants in plant growing areas2023
Inspection system for use in monitoring plants in plant growth areas2022
System for utilizing excess heat for carrying out electrochemical reactions2019
Device and apparatus for carrying out chemical dissociation reactions at elevate2018
Lateral shift measurement using an optical technique2017
Optical system and method for measurement of one or more parameters of via-holes2015