Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11946875 | Optical phase measurement system and method | Gilad Barak, Dror Shafir, Yanir Hainick | 2024-04-02 |
| 11512943 | Optical system and method for measuring parameters of patterned structures in micro-electronic devices | Danny Grossman, Moshe Vanhotsker, Guy ENGEL, Elad Dotan | 2022-11-29 |
| 11460415 | Optical phase measurement system and method | Gilad Barak, Dror Shafir, Yanir Hainick | 2022-10-04 |
| 10663408 | Optical phase measurement system and method | Gilad Barak, Dror Shafir, Yanir Hainick | 2020-05-26 |
| 10365231 | Optical phase measurement method and system | Gilad Barak, Dror Shafir, Yanir Hainick | 2019-07-30 |
| 9897553 | Optical phase measurement method and system | Gilad Barak, Dror Shafir, Yanir Hainick | 2018-02-20 |
| 7330259 | Optical measurements of patterned articles | Moshe Finarov | 2008-02-12 |
| 6815947 | Method and system for thickness measurements of thin conductive layers | David Scheiner, Yoav Many, Rahamin Guliamov | 2004-11-09 |