Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994374 | Integrated measurement system | Elad Dotan, Shimon Yalov, Valery Deich, Roi Ringel, Beni Shulman +2 more | 2024-05-28 |
| 11512943 | Optical system and method for measuring parameters of patterned structures in micro-electronic devices | Danny Grossman, Shahar Gov, Guy ENGEL, Elad Dotan | 2022-11-29 |