Issued Patents All Time
Showing 25 most recent of 87 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12375026 | Mount for vertical photovoltaic modules | Yehoshua Sheinman | 2025-07-29 |
| 12349497 | Pattern transfer printing of multi-layered features | Eyal Cohen | 2025-07-01 |
| 12337608 | Dynamic pattern transfer printing and pattern transfer sheets with spaced groups of trenches | Amir Noy, Gad Igra, Oren Lavi Stern, Eran Yunger | 2025-06-24 |
| 11910537 | Pattern transfer printing systems and methods | Gad Igra, Eyal Cohen, Eran Yunger, Tao Xu, Jing Shi +2 more | 2024-02-20 |
| 9960286 | Solar cell bus bars | — | 2018-05-01 |
| 9785059 | Lateral shift measurement using an optical technique | Boaz Brill, David Scheiner | 2017-10-10 |
| 9616524 | Light induced patterning | Mikhael Matusovsky, Amir Noy, Giora Dishon | 2017-04-11 |
| 9310192 | Lateral shift measurement using an optical technique | Boaz Brill, David Schiener | 2016-04-12 |
| 9291911 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Zvi Nirel, Yoel Cohen | 2016-03-22 |
| 9184102 | Method and system for measuring patterned structures | Boaz Brill | 2015-11-10 |
| 8941832 | Lateral shift measurement using an optical technique | Boaz Brill, David Schiener | 2015-01-27 |
| 8858296 | Method and system for endpoint detection | — | 2014-10-14 |
| 8780320 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Zvi Nirel, Yoel Cohen | 2014-07-15 |
| 8652872 | Solar cells and method of manufacturing thereof | Mikhael Matusovsky, Amir Noy | 2014-02-18 |
| 8564793 | Thin films measurement method and system | Yoel Cohen, Klara Vinokur | 2013-10-22 |
| 8552394 | Vacuum UV based optical measuring method and system | — | 2013-10-08 |
| 8531678 | Method and system for measuring patterned structures | Boaz Brill | 2013-09-10 |
| 8482715 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Zvi Nirel, Yoel Cohen | 2013-07-09 |
| 8363219 | Lateral shift measurement using an optical technique | Boaz Brill, David Schiener | 2013-01-29 |
| 8277281 | Method and system for endpoint detection | — | 2012-10-02 |
| 8049882 | Spectrometric optical method and system providing required signal-to-noise of measurements | — | 2011-11-01 |
| 8040532 | Thin films measurement method and system | Yoel Cohen, Klara Vinokur | 2011-10-18 |
| 8023122 | Method and system for measuring patterned structures | Boaz Brill | 2011-09-20 |
| 7927184 | Method and system for endpoint detection | — | 2011-04-19 |
| 7864344 | Method and system for measuring patterned structures | Boaz Brill | 2011-01-04 |