| 12375026 |
Mount for vertical photovoltaic modules |
Yehoshua Sheinman |
2025-07-29 |
|
| 12349497 |
Pattern transfer printing of multi-layered features |
Eyal Cohen |
2025-07-01 |
|
| 12337608 |
Dynamic pattern transfer printing and pattern transfer sheets with spaced groups of trenches |
Amir Noy, Gad Igra, Oren Lavi Stern, Eran Yunger |
2025-06-24 |
|
| 11910537 |
Pattern transfer printing systems and methods |
Gad Igra, Eyal Cohen, Eran Yunger, Tao Xu, Jing Shi +2 more |
2024-02-20 |
|
| 9960286 |
Solar cell bus bars |
— |
2018-05-01 |
|
| 9785059 |
Lateral shift measurement using an optical technique |
Boaz Brill, David Scheiner |
2017-10-10 |
$8,363,000 |
| 9616524 |
Light induced patterning |
Mikhael Matusovsky, Amir Noy, Giora Dishon |
2017-04-11 |
|
| 9310192 |
Lateral shift measurement using an optical technique |
Boaz Brill, David Schiener |
2016-04-12 |
$1,450,000 |
| 9291911 |
Monitoring apparatus and method particularly useful in photolithographically processing substrates |
Giora Dishon, Zvi Nirel, Yoel Cohen |
2016-03-22 |
$1,414,000 |
| 9184102 |
Method and system for measuring patterned structures |
Boaz Brill |
2015-11-10 |
$1,550,000 |
| 8941832 |
Lateral shift measurement using an optical technique |
Boaz Brill, David Schiener |
2015-01-27 |
$1,940,000 |
| 8858296 |
Method and system for endpoint detection |
— |
2014-10-14 |
$1,605,000 |
| 8780320 |
Monitoring apparatus and method particularly useful in photolithographically processing substrates |
Giora Dishon, Zvi Nirel, Yoel Cohen |
2014-07-15 |
|
| 8652872 |
Solar cells and method of manufacturing thereof |
Mikhael Matusovsky, Amir Noy |
2014-02-18 |
|
| 8564793 |
Thin films measurement method and system |
Yoel Cohen, Klara Vinokur |
2013-10-22 |
$1,390,000 |
| 8552394 |
Vacuum UV based optical measuring method and system |
— |
2013-10-08 |
$1,354,000 |
| 8531678 |
Method and system for measuring patterned structures |
Boaz Brill |
2013-09-10 |
$704,000 |
| 8482715 |
Monitoring apparatus and method particularly useful in photolithographically processing substrates |
Giora Dishon, Zvi Nirel, Yoel Cohen |
2013-07-09 |
$1,579,000 |
| 8363219 |
Lateral shift measurement using an optical technique |
Boaz Brill, David Schiener |
2013-01-29 |
$1,738,000 |
| 8277281 |
Method and system for endpoint detection |
— |
2012-10-02 |
$1,536,000 |
| 8049882 |
Spectrometric optical method and system providing required signal-to-noise of measurements |
— |
2011-11-01 |
$2,028,000 |
| 8040532 |
Thin films measurement method and system |
Yoel Cohen, Klara Vinokur |
2011-10-18 |
$1,774,000 |
| 8023122 |
Method and system for measuring patterned structures |
Boaz Brill |
2011-09-20 |
$1,704,000 |
| 7927184 |
Method and system for endpoint detection |
— |
2011-04-19 |
$3,375,000 |
| 7864344 |
Method and system for measuring patterned structures |
Boaz Brill |
2011-01-04 |
$1,492,000 |