Issued Patents All Time
Showing 25 most recent of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12213733 | System and method for detecting physical characteristics of a multilayered tissue of a subject | Ra'anan Gefen, Yoel Arieli, Lee Barnea Nehoshtan, Naor Deri | 2025-02-04 |
| 12023099 | System and method for performing tear film structure measurement | Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen | 2024-07-02 |
| 11965777 | Apparatus and methods for calibrating optical measurements | Ra'anan Gefen, Shlomi Epstein, Yoel Arieli | 2024-04-23 |
| 11116394 | System and method for performing tear film structure measurement | Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen | 2021-09-14 |
| 10612913 | Apparatus and methods for performing tomography and/or topography measurements on an object | Yoel Arieli | 2020-04-07 |
| 10456029 | Apparatus and method for detecting surface topography | Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen | 2019-10-29 |
| 10415954 | Method for analyzing an object | Yoel Arieli | 2019-09-17 |
| 10330462 | System for analyzing optical properties of an object | Yoel Arieli | 2019-06-25 |
| 10119903 | Interferometric ellipsometry and method using conical refraction | Yoel Arieli | 2018-11-06 |
| 10054419 | Method for analyzing an object using a combination of long and short coherence interferometry | Yoel Arieli | 2018-08-21 |
| 10054429 | System for tomography and/or topography measurements of a layered objects | Yoel Arieli | 2018-08-21 |
| 10024650 | System for analyzing optical properties of an object | Yoel Arieli | 2018-07-17 |
| 10024783 | Interferometric ellipsometry and method using conical refraction | Yoel Arieli | 2018-07-17 |
| 9833139 | System and method for performing tear film structure measurement | Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen | 2017-12-05 |
| 9757027 | System and method for performing tear film structure measurement and evaporation rate measurements | Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen | 2017-09-12 |
| 9291911 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Moshe Finarov, Zvi Nirel | 2016-03-22 |
| 8964178 | Method and system for use in monitoring properties of patterned structures | Boaz Brill | 2015-02-24 |
| 8780320 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Moshe Finarov, Zvi Nirel | 2014-07-15 |
| 8643842 | Method and system for use in monitoring properties of patterned structures | Boaz Brill | 2014-02-04 |
| 8564793 | Thin films measurement method and system | Moshe Finarov, Klara Vinokur | 2013-10-22 |
| 8482715 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Moshe Finarov, Zvi Nirel | 2013-07-09 |
| 8289515 | Method and system for use in monitoring properties of patterned structures | Boaz Brill | 2012-10-16 |
| 8040532 | Thin films measurement method and system | Moshe Finarov, Klara Vinokur | 2011-10-18 |
| 7821614 | Monitoring apparatus and method particularly useful in photolithographically processing substrates | Giora Dishon, Moshe Finarov, Zvi Nirel | 2010-10-26 |
| 7595896 | Thin films measurement method and system | Moshe Finarov, Klara Vinokur | 2009-09-29 |