Yoel Cohen — 35 Patents at Nova Measuring Instruments

Yoel Cohen has been granted 35 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 2000 and the most recent in February 2025. Yoel Cohen ranks #96,288 of 4,157,543 US inventors in our database (top 2.3%). Patent records list Yoel Cohen in Nes Ziona, IL.

Issued Patents All Time

Showing 1–25 of 35 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12213733	System and method for detecting physical characteristics of a multilayered tissue of a subject	Ra'anan Gefen, Yoel Arieli, Lee Barnea Nehoshtan, Naor Deri	2025-02-04
12023099	System and method for performing tear film structure measurement	Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen	2024-07-02
11965777	Apparatus and methods for calibrating optical measurements	Ra'anan Gefen, Shlomi Epstein, Yoel Arieli	2024-04-23
11116394	System and method for performing tear film structure measurement	Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen	2021-09-14
10612913	Apparatus and methods for performing tomography and/or topography measurements on an object	Yoel Arieli	2020-04-07
10456029	Apparatus and method for detecting surface topography	Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen	2019-10-29
10415954	Method for analyzing an object	Yoel Arieli	2019-09-17
10330462	System for analyzing optical properties of an object	Yoel Arieli	2019-06-25
10119903	Interferometric ellipsometry and method using conical refraction	Yoel Arieli	2018-11-06
10054419	Method for analyzing an object using a combination of long and short coherence interferometry	Yoel Arieli	2018-08-21
10054429	System for tomography and/or topography measurements of a layered objects	Yoel Arieli	2018-08-21
10024650	System for analyzing optical properties of an object	Yoel Arieli	2018-07-17
10024783	Interferometric ellipsometry and method using conical refraction	Yoel Arieli	2018-07-17
9833139	System and method for performing tear film structure measurement	Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen	2017-12-05
9757027	System and method for performing tear film structure measurement and evaporation rate measurements	Yoel Arieli, Shlomi Epstein, Dror Arbel, Ra'anan Gefen	2017-09-12
9291911	Monitoring apparatus and method particularly useful in photolithographically processing substrates	Giora Dishon, Moshe Finarov, Zvi Nirel	2016-03-22	$1,414,000
8964178	Method and system for use in monitoring properties of patterned structures	Boaz Brill	2015-02-24	$1,772,000
8780320	Monitoring apparatus and method particularly useful in photolithographically processing substrates	Giora Dishon, Moshe Finarov, Zvi Nirel	2014-07-15
8643842	Method and system for use in monitoring properties of patterned structures	Boaz Brill	2014-02-04	$1,546,000
8564793	Thin films measurement method and system	Moshe Finarov, Klara Vinokur	2013-10-22	$1,390,000
8482715	Monitoring apparatus and method particularly useful in photolithographically processing substrates	Giora Dishon, Moshe Finarov, Zvi Nirel	2013-07-09	$1,579,000
8289515	Method and system for use in monitoring properties of patterned structures	Boaz Brill	2012-10-16	$1,578,000
8040532	Thin films measurement method and system	Moshe Finarov, Klara Vinokur	2011-10-18	$1,774,000
7821614	Monitoring apparatus and method particularly useful in photolithographically processing substrates	Giora Dishon, Moshe Finarov, Zvi Nirel	2010-10-26	$2,295,000
7595896	Thin films measurement method and system	Moshe Finarov, Klara Vinokur	2009-09-29	$2,938,000

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Yoel Cohen — 35 Patents

Issued Patents All Time

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