Issued Patents All Time
Showing 25 most recent of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12152869 | Monitoring system and method for verifying measurements in patterned structures | Boris Sherman, Igor Turovets | 2024-11-26 |
| 10575765 | Analyte-sensing device | — | 2020-03-03 |
| 10295329 | Monitoring system and method for verifying measurements in patterned structures | Boris Sherman, Igor Turovets | 2019-05-21 |
| 10048595 | Process control using non-zero order diffraction | — | 2018-08-14 |
| 9904993 | Method and system for optimizing optical inspection of patterned structures | — | 2018-02-27 |
| 9785059 | Lateral shift measurement using an optical technique | Moshe Finarov, David Scheiner | 2017-10-10 |
| 9568872 | Process control using non-zero order diffraction | — | 2017-02-14 |
| 9310192 | Lateral shift measurement using an optical technique | Moshe Finarov, David Schiener | 2016-04-12 |
| 9184102 | Method and system for measuring patterned structures | Moshe Finarov | 2015-11-10 |
| 9140544 | Optical system and method for measuring in patterned structures | Gilad Barak | 2015-09-22 |
| 8964178 | Method and system for use in monitoring properties of patterned structures | Yoel Cohen | 2015-02-24 |
| 8941832 | Lateral shift measurement using an optical technique | Moshe Finarov, David Schiener | 2015-01-27 |
| 8848185 | Optical system and method for measuring in three-dimensional structures | Gilad Barak | 2014-09-30 |
| 8658982 | Optical method and system utilizing operating with deep or vacuum UV spectra | Oleg Korshunov | 2014-02-25 |
| 8643842 | Method and system for use in monitoring properties of patterned structures | Yoel Cohen | 2014-02-04 |
| 8531678 | Method and system for measuring patterned structures | Moshe Finarov | 2013-09-10 |
| 8488128 | Line edge roughness measuring technique and test structure | — | 2013-07-16 |
| 8363219 | Lateral shift measurement using an optical technique | Moshe Finarov, David Schiener | 2013-01-29 |
| 8289515 | Method and system for use in monitoring properties of patterned structures | Yoel Cohen | 2012-10-16 |
| 8023122 | Method and system for measuring patterned structures | Moshe Finarov | 2011-09-20 |
| 7864344 | Method and system for measuring patterned structures | Moshe Finarov | 2011-01-04 |
| 7864343 | Method and system for measuring patterned structures | Moshe Finarov | 2011-01-04 |
| 7791740 | Method and system for measuring patterned structures | Moshe Finarov | 2010-09-07 |
| 7760368 | Method and system for measuring patterned structures | Moshe Finarov | 2010-07-20 |
| 7715007 | Lateral shift measurement using an optical technique | Moshe Finarov, David Schiener | 2010-05-11 |