IT

Igor Turovets

NI Nova Measuring Instruments: 8 patents #15 of 108Top 15%
NO Nova: 4 patents #12 of 75Top 20%
NI Nanoptics, Incorporated: 3 patents #6 of 23Top 30%
IBM: 1 patents #44,794 of 70,183Top 65%
Overall (All Time): #290,249 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12165023 Measuring local CD uniformity using scatterometry and machine learning Dexin Kong, Daniel Schmidt, Aron Cepler, Marjorie Cheng, Roy Koret 2024-12-10
12152869 Monitoring system and method for verifying measurements in patterned structures Boaz Brill, Boris Sherman 2024-11-26
11639901 Test structure design for metrology measurements in patterned samples Gilad Barak, Oded Cohen 2023-05-02
11335612 Apparatus and method for electrical test prediction 2022-05-17
11143601 Test structure design for metrology measurements in patterned samples Gilad Barak, Oded Cohen 2021-10-12
10978321 Method and system for processing patterned structures 2021-04-13
10295329 Monitoring system and method for verifying measurements in patterned structures Boaz Brill, Boris Sherman 2019-05-21
10226852 Surface planarization system and method 2019-03-12
10216098 Test structure for use in metrology measurements of patterns Oded Cohen, Gilad Barak 2019-02-26
10197506 Optical metrology for in-situ measurements Cornel Bozdog, Dario Elyasi 2019-02-05
10066936 Test structures and metrology technique utilizing the test structures for measuring in patterned structures 2018-09-04
9915624 Optical metrology for in-situ measurements Cornel Bozdog, Dario Elyasi 2018-03-13
9528946 Optical metrology for in-situ measurements Cornel Bozdog, Dario Elyasi 2016-12-27
6620160 Method and device for electro microsurgery in a physiological liquid environment Aaron Lewis, Daniel V. Palanker 2003-09-16
6352535 Method and a device for electro microsurgery in a physiological liquid environment Aaron Lewis, Daniel V. Palanker 2002-03-05
6039726 Method and apparatus for concentrating laser beams Aaron Lewis, Daniel V. Palanker 2000-03-21