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USPTO Patent Rankings Data through Dec 31, 2025
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Igor Turovets — 17 Patents

NINova Measuring Instruments: 8 patents #15 of 108Top 15%
NONova: 4 patents #12 of 75Top 20%
NINanoptics, Incorporated: 3 patents #6 of 23Top 30%
IBM: 1 patents #44,878 of 70,183Top 65%
Mevaseret Tsiyon, IL: #12 of 225 inventorsTop 6%
Overall (All Time): #263,971 of 4,157,543Top 7%
17 Patents All Time
Igor Turovets has been granted 17 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 2000 and the most recent in December 2025. Igor Turovets ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Igor Turovets in Mevaseret Tsiyon, IL.

Patents per Year

Patents granted per year, 2000 to 2024Bar chart with a peak of 4 patents in 2019.peak 42000: 1 patents20002002: 1 patents20022003: 1 patents20032016: 1 patents20162018: 2 patents20182019: 4 patents20192021: 2 patents20212022: 1 patents20222023: 1 patents20232024: 2 patents2024

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12498332 Imaging metrology Shimon Yalov, Alex Shichtman, Michael Matusovsky, Shachar Paz 2025-12-16
12165023 Measuring local CD uniformity using scatterometry and machine learning Dexin Kong, Daniel Schmidt, Aron Cepler, Marjorie Cheng, Roy Koret 2024-12-10
12152869 Monitoring system and method for verifying measurements in patterned structures Boaz Brill, Boris Sherman 2024-11-26
11639901 Test structure design for metrology measurements in patterned samples Gilad Barak, Oded Cohen 2023-05-02
11335612 Apparatus and method for electrical test prediction — 2022-05-17
11143601 Test structure design for metrology measurements in patterned samples Gilad Barak, Oded Cohen 2021-10-12
10978321 Method and system for processing patterned structures — 2021-04-13 $9,922,000
10295329 Monitoring system and method for verifying measurements in patterned structures Boaz Brill, Boris Sherman 2019-05-21 $4,306,000
10226852 Surface planarization system and method — 2019-03-12 $4,323,000
10216098 Test structure for use in metrology measurements of patterns Oded Cohen, Gilad Barak 2019-02-26 $4,373,000
10197506 Optical metrology for in-situ measurements Cornel Bozdog, Dario Elyasi 2019-02-05 $4,552,000
10066936 Test structures and metrology technique utilizing the test structures for measuring in patterned structures — 2018-09-04 $6,621,000
9915624 Optical metrology for in-situ measurements Cornel Bozdog, Dario Elyasi 2018-03-13 $8,879,000
9528946 Optical metrology for in-situ measurements Cornel Bozdog, Dario Elyasi 2016-12-27 $1,761,000
6620160 Method and device for electro microsurgery in a physiological liquid environment Aaron Lewis, Daniel V. Palanker 2003-09-16
6352535 Method and a device for electro microsurgery in a physiological liquid environment Aaron Lewis, Daniel V. Palanker 2002-03-05
6039726 Method and apparatus for concentrating laser beams Aaron Lewis, Daniel V. Palanker 2000-03-21

Frequent Collaborators

Cornel Bozdog3 shared
Dario Elyasi3 shared
Gilad Barak3 shared
Daniel V. Palanker3 shared
Oded Cohen3 shared
Aaron Lewis3 shared

Nearby-Ranked Inventors

Michael John Caelwaerts17
Umut Zalluhoglu17
Austino Longo17
Till Bredbeck17
Mircea Grigore17
Achim Klein17
Manesh Nadupparambil Sekharan17
Yoshiaki Nishikawa17
Evan Sparks17