OC

Oded Cohen

NA Nativo: 10 patents #2 of 6Top 35%
NO Nova: 5 patents #10 of 75Top 15%
NI Nova Measuring Instruments: 3 patents #36 of 108Top 35%
AS Aladdin Knowledge Systems: 3 patents #3 of 30Top 10%
IN Intel: 2 patents #13,213 of 30,777Top 45%
ST Sizmek Technologies: 1 patents #9 of 24Top 40%
Overall (All Time): #115,309 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 25 most recent of 31 patents

Patent #TitleCo-InventorsDate
12321102 Machine and deep learning methods for spectra-based metrology and process control Barak Bringoltz, Ran YACOBY, Noam Tal, Shay Yogev, Boaz STURLESI 2025-06-03
12288228 Edge bidding system for online ads Justin Yoo Choi, Marcelo Muniz 2025-04-29
12236364 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2025-02-25
12063902 Method of regenerating cannabis Moshe Flaishman, Reut COHEN PEER, Samuel Bocobza 2024-08-20
11995397 Making real-time content selection decisions based on multivariate testing Justin Yoo Choi, Marcelo Muniz 2024-05-28
11827892 Nucleic acid constructs and methods of using same Moshe Flaishman, Reut COHEN PEER, Samuel Bocobza 2023-11-28
11815819 Machine and deep learning methods for spectra-based metrology and process control Barak Bringoltz, Ran YACOBY, Noam Tal, Shay Yogev, Boaz STURLESI 2023-11-14
11763181 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2023-09-19
11682049 Edge bidding system for online ads Justin Yoo Choi, Marcelo Muniz 2023-06-20
11663286 Server side web based ad stitching and user specific optimization Justin Yoo Choi 2023-05-30
11651046 Optimizing third party tag insertion Justin Yoo Choi, Marcelo Muniz 2023-05-16
11639901 Test structure design for metrology measurements in patterned samples Gilad Barak, Igor Turovets 2023-05-02
11630949 Making real-time content selection decisions based on multivariate testing Justin Yoo Choi, Marcelo Muniz 2023-04-18
11402740 Real-time tracking for three-dimensional imaging Vardit Eckhouse, Igor Altman 2022-08-02
D958784 Wearable posture detection device Ran Kazes, Liran Doron 2022-07-26
11275813 Optimizing third party tag insertion Justin Yoo Choi, Marcelo Muniz 2022-03-15
11250094 Server side web based ad stitching and user specific optimization Justin Yoo Choi 2022-02-15
11238216 Making real-time content selection decisions based on multivariate testing Justin Yoo Choi, Marcelo Muniz 2022-02-01
11143601 Test structure design for metrology measurements in patterned samples Gilad Barak, Igor Turovets 2021-10-12
11093840 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2021-08-17
10942439 Real-time tracking for three-dimensional imaging Vardit Eckhouse, Igor Altman 2021-03-09
10817585 Server side web based ad stitching and user specific optimization Justin Yoo Choi 2020-10-27
10359369 Metrology test structure design and measurement scheme for measuring in patterned structures Gilad Barak 2019-07-23
D852656 Wearable device Ran Kazes 2019-07-02
10216098 Test structure for use in metrology measurements of patterns Gilad Barak, Igor Turovets 2019-02-26