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USPTO Patent Rankings Data through Dec 31, 2025
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Oded Cohen — 31 Patents

NANativo: 10 patents #2 of 6Top 35%
NONova: 5 patents #10 of 75Top 15%
NINova Measuring Instruments: 3 patents #36 of 108Top 35%
ASAladdin Knowledge Systems: 3 patents #3 of 30Top 10%
TCThe State Of Israel, Ministry Of Agriculture & Rural Development, Agricultural Research Organization (Aro) (Volcani Center): 2 patents #7 of 122Top 6%
Intel: 2 patents #13,316 of 30,777Top 45%
STSizmek Technologies: 1 patents #9 of 24Top 40%
Overall (All Time): #115,823 of 4,157,543Top 3%
31 Patents All Time
Oded Cohen has been granted 31 US patents while listed as an inventor at Nativo. The first was granted in 2006 and the most recent in June 2025. Oded Cohen ranks #115,823 of 4,157,543 US inventors in our database (top 2.8%). Patent records list Oded Cohen in Rehovot, CA, IL.

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12321102 Machine and deep learning methods for spectra-based metrology and process control Barak Bringoltz, Ran YACOBY, Noam Tal, Shay Yogev, Boaz STURLESI 2025-06-03
12288228 Edge bidding system for online ads Justin Yoo Choi, Marcelo Muniz 2025-04-29
12236364 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2025-02-25
12063902 Method of regenerating cannabis Moshe Flaishman, Reut COHEN PEER, Samuel Bocobza 2024-08-20
11995397 Making real-time content selection decisions based on multivariate testing Justin Yoo Choi, Marcelo Muniz 2024-05-28
11827892 Nucleic acid constructs and methods of using same Moshe Flaishman, Reut COHEN PEER, Samuel Bocobza 2023-11-28
11815819 Machine and deep learning methods for spectra-based metrology and process control Barak Bringoltz, Ran YACOBY, Noam Tal, Shay Yogev, Boaz STURLESI 2023-11-14
11763181 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2023-09-19
11682049 Edge bidding system for online ads Justin Yoo Choi, Marcelo Muniz 2023-06-20
11663286 Server side web based ad stitching and user specific optimization Justin Yoo Choi 2023-05-30
11651046 Optimizing third party tag insertion Justin Yoo Choi, Marcelo Muniz 2023-05-16
11639901 Test structure design for metrology measurements in patterned samples Gilad Barak, Igor Turovets 2023-05-02
11630949 Making real-time content selection decisions based on multivariate testing Justin Yoo Choi, Marcelo Muniz 2023-04-18
11402740 Real-time tracking for three-dimensional imaging Vardit Eckhouse, Igor Altman 2022-08-02
D958784 Wearable posture detection device Ran Kazes, Liran Doron 2022-07-26
11275813 Optimizing third party tag insertion Justin Yoo Choi, Marcelo Muniz 2022-03-15
11250094 Server side web based ad stitching and user specific optimization Justin Yoo Choi 2022-02-15
11238216 Making real-time content selection decisions based on multivariate testing Justin Yoo Choi, Marcelo Muniz 2022-02-01
11143601 Test structure design for metrology measurements in patterned samples Gilad Barak, Igor Turovets 2021-10-12
11093840 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2021-08-17 $19,081,000
10942439 Real-time tracking for three-dimensional imaging Vardit Eckhouse, Igor Altman 2021-03-09
10817585 Server side web based ad stitching and user specific optimization Justin Yoo Choi 2020-10-27
10359369 Metrology test structure design and measurement scheme for measuring in patterned structures Gilad Barak 2019-07-23 $4,833,000
D852656 Wearable device Ran Kazes 2019-07-02
10216098 Test structure for use in metrology measurements of patterns Gilad Barak, Igor Turovets 2019-02-26 $4,373,000

Nearby-Ranked Inventors

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Lina Zhang31