| 12236364 |
Metrology and process control for semiconductor manufacturing |
EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more |
2025-02-25 |
| 12038271 |
Detecting outliers and anomalies for OCD metrology machine learning |
EITAN ROTHSTEIN, Yongha Kim, ARIEL BROITMAN, OLGA KRASNYKOV, Barak Bringoltz |
2024-07-16 |
| 11763181 |
Metrology and process control for semiconductor manufacturing |
EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more |
2023-09-19 |
| 11093840 |
Metrology and process control for semiconductor manufacturing |
EITAN ROTHSTEIN, Noam Tal, Barak Bringoltz, Yongha Kim, ARIEL BROITMAN +5 more |
2021-08-17 |
| 5618469 |
Polyaniline-containing solution, articles coated therewith, and methods for the preparation of same |
Eli Harlev, Tamilla GULAKHMEDOVA |
1997-04-08 |