Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12236364 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2025-02-25 |
| 12038271 | Detecting outliers and anomalies for OCD metrology machine learning | EITAN ROTHSTEIN, Yongha Kim, Ilya Rubinovich, OLGA KRASNYKOV, Barak Bringoltz | 2024-07-16 |
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2023-09-19 |
| 11093840 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2021-08-17 |