Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
SY

Shay Yogev — 9 Patents

NONova: 7 patents #6 of 75Top 8%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
NINova Measuring Instruments: 1 patents #69 of 108Top 65%
Kfar Menahem, IL: #2 of 5 inventorsTop 40%
Overall (All Time): #535,341 of 4,157,543Top 15%
9 Patents All Time
Shay Yogev has been granted 9 US patents while listed as an inventor at Nova. The first was granted in 2021 and the most recent in November 2025. Shay Yogev ranks #535,341 of 4,157,543 US inventors in our database (top 12.9%). Patent records list Shay Yogev in Kfar Menahem, IL.

Patents per Year

Patents granted per year, 2021 to 2025Bar chart with a peak of 3 patents in 2025.peak 32021: 2 patents20212022: 1 patents20222023: 2 patents20232024: 1 patents20242025: 3 patents2025

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12469124 Machine learning based yield prediction Boris Levant, Noam Tal, Ran YACOBY, Lilach Choona, Shaul Pres +2 more 2025-11-11
12321102 Machine and deep learning methods for spectra-based metrology and process control Barak Bringoltz, Ran YACOBY, Noam Tal, Boaz STURLESI, Oded Cohen 2025-06-03
12236364 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2025-02-25
11929291 Layer detection for high aspect ratio etch control Gil Loewenthal, Yoav Etzioni 2024-03-12
11815819 Machine and deep learning methods for spectra-based metrology and process control Barak Bringoltz, Ran YACOBY, Noam Tal, Boaz STURLESI, Oded Cohen 2023-11-14
11763181 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2023-09-19
11300948 Process control of semiconductor fabrication based on spectra quality metrics Taher Kagalwala, Alok Vaid, Matthew Sendelbach, Paul ISBESTER, Yoav Etzioni 2022-04-12
11107738 Layer detection for high aspect ratio etch control Gil Loewenthal, Yoav Etzioni 2021-08-31
11093840 Metrology and process control for semiconductor manufacturing EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more 2021-08-17 $19,081,000