Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12321102 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Ran YACOBY, Noam Tal, Boaz STURLESI, Oded Cohen | 2025-06-03 |
| 12236364 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2025-02-25 |
| 11929291 | Layer detection for high aspect ratio etch control | Gil Loewenthal, Yoav Etzioni | 2024-03-12 |
| 11815819 | Machine and deep learning methods for spectra-based metrology and process control | Barak Bringoltz, Ran YACOBY, Noam Tal, Boaz STURLESI, Oded Cohen | 2023-11-14 |
| 11763181 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2023-09-19 |
| 11300948 | Process control of semiconductor fabrication based on spectra quality metrics | Taher Kagalwala, Alok Vaid, Matthew Sendelbach, Paul ISBESTER, Yoav Etzioni | 2022-04-12 |
| 11107738 | Layer detection for high aspect ratio etch control | Gil Loewenthal, Yoav Etzioni | 2021-08-31 |
| 11093840 | Metrology and process control for semiconductor manufacturing | EITAN ROTHSTEIN, Ilya Rubinovich, Noam Tal, Barak Bringoltz, Yongha Kim +5 more | 2021-08-17 |