Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11300948 | Process control of semiconductor fabrication based on spectra quality metrics | Taher Kagalwala, Alok Vaid, Shay Yogev, Matthew Sendelbach, Yoav Etzioni | 2022-04-12 |
| 10534275 | Method for use in process control of manufacture of patterned sample | Cornel Bozdog, Aron Cepler | 2020-01-14 |