Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Marjorie Cheng, Roy Koret, Igor Turovets | 2024-12-10 | |
| 11295969 | Hybridization for characterization and metrology | Gangadhara Raja Muthinti, Matthew Sendelbach, Roy Koret, Wei Ti Lee | 2022-04-05 | $5,706,000 |
| 10534275 | Method for use in process control of manufacture of patterned sample | Cornel Bozdog, Paul ISBESTER | 2020-01-14 | $3,001,000 |