Issued Patents All Time
Showing 25 most recent of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12281893 | Characterizing and measuring in small boxes using XPS with multiple measurements | Heath A. Pois, Laxmi WARAD, Dmitry Kislitsyn, Parker Lund, Benny Tseng +2 more | 2025-04-22 |
| 12158437 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Kavita Shah | 2024-12-03 |
| 12066391 | Method and system for non-destructive metrology of thin layers | Heath A. Pois, Mark Klare, Cornel Bozdog | 2024-08-20 |
| 11997932 | Resistive switching memory having confined filament formation and methods thereof | Sundar Narayanan, Wee Chen Gan, Natividad Vasquez | 2024-05-28 |
| 11988502 | Characterizing and measuring in small boxes using XPS with multiple measurements | Heath A. Pois, Laxmi WARAD, Dmitry Kislitsyn, Parker Lund, Benny Tseng +2 more | 2024-05-21 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Heath A. Pois, Mark Klare, Cornel Bozdog, Alok Vaid | 2024-02-20 |
| 11733035 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Lawrence V. Bot, Michael Kwan, Mark Klare, Charles Thomas Larson | 2023-08-22 |
| 11680915 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Kavita Shah | 2023-06-20 |
| 11668663 | Method and system for non-destructive metrology of thin layers | Heath A. Pois, Mark Klare, Cornel Bozdog | 2023-06-06 |
| 11346795 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Kavita Shah | 2022-05-31 |
| 11295969 | Hybridization for characterization and metrology | Gangadhara Raja Muthinti, Matthew Sendelbach, Roy Koret, Aron Cepler | 2022-04-05 |
| 11029148 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Lawrence V. Bot, Michael Kwan, Mark Klare, Charles Thomas Larson | 2021-06-08 |
| 10801978 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Kavita Shah | 2020-10-13 |
| 10648802 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Lawrence V. Bot, Michael Kwan, Mark Klare, Charles Thomas Larson | 2020-05-12 |
| 10533961 | Method and system for non-destructive metrology of thin layers | Heath A. Pois, Mark Klare, Cornel Bozdog | 2020-01-14 |
| 10082390 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Lawrence V. Bot, Michael Kwan, Mark Klare, Charles Thomas Larson | 2018-09-25 |
| 9952166 | Silicon germanium thickness and composition determination using combined XPS and XRF technologies | Heath A. Pois | 2018-04-24 |
| 9926639 | Methods for forming barrier/seed layers for copper interconnect structures | Hoon Kim, Sang Ho Yu, Seshadri Ganguli, Hyoung-Chan Ha, Sang-Hyeob Lee | 2018-03-27 |
| 9818939 | Resistive switching devices having a switching layer and an intermediate electrode layer and methods of formation thereof | John Ross Jameson, John Sanchez, Yi Ma, Venkatesh P. Gopinath, Foroozan Sarah Koushan | 2017-11-14 |
| 9594035 | Silicon germanium thickness and composition determination using combined XPS and XRF technologies | Heath A. Pois | 2017-03-14 |
| 9593417 | Gas line weldment design and process for CVD aluminum | Ted Guo, Steve H. Chiao, Alan A. Ritchie | 2017-03-14 |
| 9252359 | Resistive switching devices having a switching layer and an intermediate electrode layer and methods of formation thereof | John Ross Jameson, John Sanchez, Foroozan Sarah Koushan | 2016-02-02 |
| 9129945 | Formation of liner and barrier for tungsten as gate electrode and as contact plug to reduce resistance and enhance device performance | Sang-Hyeob Lee, Sang Ho Yu, Seshadri Ganguli, Hyoung-Chan Ha, Hoon Kim | 2015-09-08 |
| 9099633 | Solid electrolyte memory elements with electrode interface for improved performance | Chakravarthy Gopalan, Yi Ma, Jeffrey A. Shields | 2015-08-04 |
| 8895953 | Programmable memory elements, devices and methods having physically localized structure | Jeffrey A. Shields, John Ross Jameson | 2014-11-25 |