TG

Ted Guo

Applied Materials: 36 patents #282 of 7,310Top 4%
Overall (All Time): #84,312 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 25 most recent of 38 patents

Patent #TitleCo-InventorsDate
12238946 Perovskite/silicon heterojunction tandem solar cell and preparation method thereof Enbing BI, Qiankai BA 2025-02-25
9593417 Gas line weldment design and process for CVD aluminum Wei Ti Lee, Steve H. Chiao, Alan A. Ritchie 2017-03-14
8968536 Sputtering target having increased life and sputtering uniformity Adolph Miller Allen, Ki Hwan Yoon, Hong Yang, Sang Ho Yu 2015-03-03
8535443 Gas line weldment design and process for CVD aluminum Wei Ti Lee, Steve H. Chiao, Alan A. Ritchie 2013-09-17
7867900 Aluminum contact integration on cobalt silicide junction Wei Ti Lee, Mohd Fadzli Anwar Hassan, Sang Ho Yu 2011-01-11
7857947 Unique passivation technique for a CVD blocker plate to prevent particle formation Alan A. Ritchie, Wei Ti Lee 2010-12-28
7824743 Deposition processes for titanium nitride barrier and aluminum Wei Ti Lee, Yen-Chih Wang, Mohd Fadzli Anwar Hassan, Ryeun Kwan Kim, Hyung Chul Park +1 more 2010-11-02
7378002 Aluminum sputtering while biasing wafer Wei Ti Lee, Sang Ho Yu 2008-05-27
7186319 Multi-track magnetron exhibiting more uniform deposition and reduced rotational asymmetry Hong Yang, Tza-Jing Gung, Jian Lei 2007-03-06
7112528 Fully planarized dual damascene metallization using copper line interconnect and selective CVD aluminum plug Liang-Yuh Chen, Roderick Craig Mosley, Fusen Chen 2006-09-26
6743714 Low temperature integrated metallization process and apparatus Roderick C. Mosely, Hong Mei Zhang, Fusen Chen, Liang-Yuh Chen 2004-06-01
6726776 Low temperature integrated metallization process and apparatus Roderick C. Mosely, Hong Mei Zhang, Fusen Chen 2004-04-27
6716733 CVD-PVD deposition process Wei Ti Lee 2004-04-06
6656831 Plasma-enhanced chemical vapor deposition of a metal nitride layer Wei Ti Lee 2003-12-02
6605531 Hole-filling technique using CVD aluminum and PVD aluminum integration Wei Shi, Liang-Yuh Chen 2003-08-12
6537905 Fully planarized dual damascene metallization using copper line interconnect and selective CVD aluminum plug Liang-Yuh Chen, Roderick Craig Mosley, Fusen Chen 2003-03-25
6528180 Liner materials Wei Ti Lee, Gongda Yao 2003-03-04
6518176 Method of selective formation of a barrier layer for a contact level via Liang-Yuh Chen, Suchitra Subrahmanyan, Roderick C. Mosely 2003-02-11
6509274 Method for forming aluminum lines over aluminum-filled vias in a semiconductor substrate Jing-Pei (Connie) Chou, Liang-Yuh Chen, Roderick C. Mosely 2003-01-21
6458684 Single step process for blanket-selective CVD aluminum deposition Liang-Yuh Chen, Mehul Naik, Roderick C. Mosely 2002-10-01
6430458 Semi-selective chemical vapor deposition Roderick C. Mosely, Liang-Yuh Chen 2002-08-06
6355560 Low temperature integrated metallization process and apparatus Roderick C. Mosely, Hong Mei Zhang, Fusen Chen 2002-03-12
6207222 Dual damascene metallization Liang-Yuh Chen, Rong Tao, Roderick C. Mosely 2001-03-27
6169030 Metallization process and method Mehul Naik, Liang-Yuh Chen, Roderick C. Mosely, Israel Beinglass 2001-01-02
6139697 Low temperature integrated via and trench fill process and apparatus Liang-Yuh Chen, Roderick C. Mosely, Fusen Chen, Rong Tao 2000-10-31