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USPTO Patent Rankings Data through Dec 31, 2025
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Mark Klare — 11 Patents

NINova Measuring Instruments: 7 patents #21 of 108Top 20%
Micron: 3 patents #3,442 of 6,374Top 55%
NONova: 1 patents #39 of 75Top 55%
GUGlobalfoundries U.S.: 1 patents #363 of 665Top 55%
Poughkeepsie, NY: #354 of 1,613 inventorsTop 25%
New York: #13,476 of 115,490 inventorsTop 15%
Overall (All Time): #435,149 of 4,157,543Top 15%
11 Patents All Time
Mark Klare has been granted 11 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 1998 and the most recent in August 2024. Mark Klare ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Mark Klare in Poughkeepsie, NY, US.

Patents per Year

Patents granted per year, 1998 to 2024Bar chart with a peak of 2 patents in 2020.peak 21998: 1 patents19981999: 1 patents19992000: 1 patents20002018: 1 patents20182020: 2 patents20202021: 1 patents20212023: 2 patents20232024: 2 patents2024

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12066391 Method and system for non-destructive metrology of thin layers Wei Ti Lee, Heath A. Pois, Cornel Bozdog 2024-08-20 $59,912,000
11906451 Method and system for non-destructive metrology of thin layers Wei Ti Lee, Heath A. Pois, Cornel Bozdog, Alok Vaid 2024-02-20
11733035 Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson 2023-08-22 $21,818,000
11668663 Method and system for non-destructive metrology of thin layers Wei Ti Lee, Heath A. Pois, Cornel Bozdog 2023-06-06 $22,360,000
11029148 Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson 2021-06-08 $10,107,000
10648802 Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson 2020-05-12 $8,932,000
10533961 Method and system for non-destructive metrology of thin layers Wei Ti Lee, Heath A. Pois, Cornel Bozdog 2020-01-14 $3,001,000
10082390 Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson 2018-09-25 $6,411,000
6100189 Second implant for agglomeration control Yong-Jun Hu, Pai-Hung Pan 2000-08-08 $31,220,000
5856698 Second implanted matrix for agglomeration control and thermal stability Yong-Jun Hu, Pai-Hung Pan 1999-01-05 $22,823,000
5739064 Second implanted matrix for agglomeration control and thermal stability Yong-Jun Hu, Pai-Hung Pan 1998-04-14 $6,055,000

Frequent Collaborators

Wei Ti Lee8 shared
Heath A. Pois8 shared
Charles Thomas Larson4 shared
Cornel Bozdog4 shared
Michael Kwan4 shared
Lawrence V. Bot4 shared

Nearby-Ranked Inventors

Ya-Ching Chang11
Hermann Lubbert11
Alexander WAITE11
Mehrad Mehr11
Matthew J. Purdey11
Nishtha Madaan11
Ian C. Richards11
Chad Huffman11
Lifeng Fan11