Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066391 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Cornel Bozdog | 2024-08-20 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Cornel Bozdog, Alok Vaid | 2024-02-20 |
| 11733035 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson | 2023-08-22 |
| 11668663 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Cornel Bozdog | 2023-06-06 |
| 11029148 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson | 2021-06-08 |
| 10648802 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson | 2020-05-12 |
| 10533961 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Cornel Bozdog | 2020-01-14 |
| 10082390 | Feed-forward of multi-layer and multi-process information using XPS and XRF technologies | Heath A. Pois, Wei Ti Lee, Lawrence V. Bot, Michael Kwan, Charles Thomas Larson | 2018-09-25 |
| 6100189 | Second implant for agglomeration control | Yong-Jun Hu, Pai-Hung Pan | 2000-08-08 |
| 5856698 | Second implanted matrix for agglomeration control and thermal stability | Yong-Jun Hu, Pai-Hung Pan | 1999-01-05 |
| 5739064 | Second implanted matrix for agglomeration control and thermal stability | Yong-Jun Hu, Pai-Hung Pan | 1998-04-14 |