Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Aron Cepler, Marjorie Cheng, Igor Turovets | 2024-12-10 | |
| 11295969 | Hybridization for characterization and metrology | Gangadhara Raja Muthinti, Matthew Sendelbach, Aron Cepler, Wei Ti Lee | 2022-04-05 | $5,706,000 |
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Vladimir Machavariani, Gilad Barak | 2020-09-01 | $10,557,000 |
| 10274435 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Vladimir Machavariani, Gilad Barak | 2019-04-30 | $4,749,000 |