Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Aron Cepler, Marjorie Cheng, Igor Turovets | 2024-12-10 |
| 11295969 | Hybridization for characterization and metrology | Gangadhara Raja Muthinti, Matthew Sendelbach, Aron Cepler, Wei Ti Lee | 2022-04-05 |
| 10761036 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Vladimir Machavariani, Gilad Barak | 2020-09-01 |
| 10274435 | Method and system for optical metrology in patterned structures | Boris Levant, Yanir Hainick, Vladimir Machavariani, Gilad Barak | 2019-04-30 |