Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Aron Cepler, Roy Koret, Igor Turovets | 2024-12-10 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Aron Cepler, Roy Koret, Igor Turovets | 2024-12-10 |