Issued Patents All Time
Showing 25 most recent of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392733 | Combined ocd and photoreflectance method and system | Yonatan Oren | 2025-08-19 |
| 12372473 | Accurate Raman spectroscopy | Eyal Hollander, Elad Schleifer, Yonatan Oren, Amir Shayari | 2025-07-29 |
| 12366533 | Hybrid metrology method and system | Yanir Hainick, Yonatan Oren | 2025-07-22 |
| 12359968 | Systems and methods for optical metrology | Yonatan Oren, Eyal Hollander, Elad Schleifer | 2025-07-15 |
| 12360462 | Optical metrology system and method | Amir Shayari | 2025-07-15 |
| 12298182 | Optical technique for material characterization | Yonatan Oren | 2025-05-13 |
| 12196691 | X-ray based measurements in patterned structure | — | 2025-01-14 |
| 12163892 | Accurate Raman spectroscopy | Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich +1 more | 2024-12-10 |
| 12152993 | Accurate Raman spectroscopy | Eyal Hollander, Elad Schleifer, Yonatan Oren, Amir Shayari | 2024-11-26 |
| 12066385 | Raman spectroscopy based measurements in patterned structures | Yanir Hainick, Yonatan Oren, Vladimir Machavariani | 2024-08-20 |
| 12025560 | Hybrid metrology method and system | Yanir Hainick, Yonatan Oren | 2024-07-02 |
| 11946875 | Optical phase measurement system and method | Dror Shafir, Yanir Hainick, Shahar Gov | 2024-04-02 |
| 11927481 | Optical technique for material characterization | Yonatan Oren | 2024-03-12 |
| 11885737 | Method and system for optical characterization of patterned samples | Dror Shafir, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog | 2024-01-30 |
| 11868054 | Optical metrology system and method | Amir Shayari | 2024-01-09 |
| 11860104 | Accurate raman spectroscopy | Eyal Hollander, Elad Schleifer, Yonatan Oren, Amir Shayari | 2024-01-02 |
| 11802829 | Method and system for broadband photoreflectance spectroscopy | Yonatan Oren | 2023-10-31 |
| 11740183 | Accurate Raman spectroscopy | Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich +1 more | 2023-08-29 |
| 11692953 | X-ray based measurements in patterned structure | — | 2023-07-04 |
| 11639901 | Test structure design for metrology measurements in patterned samples | Oded Cohen, Igor Turovets | 2023-05-02 |
| 11543294 | Optical technique for material characterization | Yonatan Oren | 2023-01-03 |
| 11460415 | Optical phase measurement system and method | Dror Shafir, Yanir Hainick, Shahar Gov | 2022-10-04 |
| 11415519 | Accurate Raman spectroscopy | Eyal Hollander, Elad Schleifer, Yonatan Oren, Amir Shayari | 2022-08-16 |
| 11366398 | Time-domain optical metrology and inspection of semiconductor devices | Michael Chemama, Smadar Ferber, Yanir Hainick, Boris Levant, Ze'ev Lindenfeld +3 more | 2022-06-21 |
| 11275027 | Raman spectroscopy based measurements in patterned structures | Yanir Hainick, Yonatan Oren, Vladimir Machavariani | 2022-03-15 |