Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11885737 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog | 2024-01-30 |
| 10876959 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog | 2020-12-29 |
| 10311198 | Overlay design optimization | Gilad Barak, Tal Verdene, Michal Haim YACHINI, Dror Shafir, Changman Moon | 2019-06-04 |
| 10209206 | Method and system for determining strain distribution in a sample | Gilad Barak, Cornel Bozdog, Matthew Sendelbach | 2019-02-19 |
| 10054423 | Optical method and system for critical dimensions and thickness characterization | Dror Shafir, Gilad Barak | 2018-08-21 |
| 8319975 | Methods and apparatus for wavefront manipulations and improved 3-D measurements | Yoel Arieli, Emmanuel Lanzmann, Gavriel Feigin, Tal Kuzniz, Yoram Saban | 2012-11-27 |
| 7609388 | Spatial wavefront analysis and 3D measurement | Yoel Arieli, David Banitt, Yosi Weitzman, Yoram Saban, Emmanuel Lanzmann +1 more | 2009-10-27 |
| 7542144 | Spatial and spectral wavefront analysis and measurement | Yoel Arieli, Eval Shekel | 2009-06-02 |
| 7327470 | Spatial and spectral wavefront analysis and measurement | Yoel Arieli, Eyal Shekel | 2008-02-05 |
| 6819435 | Spatial and spectral wavefront analysis and measurement | Yoel Arieli, Eyal Shekel | 2004-11-16 |
| 6707608 | Diffractive optical element and a method for producing same | Yoel Arieli | 2004-03-16 |