Shay Wolfling — 11 Patents at Nova Measuring Instruments

Shay Wolfling has been granted 11 US patents while listed as an inventor at Nova Measuring Instruments. The first was granted in 2004 and the most recent in January 2024. Shay Wolfling ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Shay Wolfling in Kiryat Ono, IL.

Patents per Year

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Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11885737	Method and system for optical characterization of patterned samples	Dror Shafir, Gilad Barak, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog	2024-01-30
10876959	Method and system for optical characterization of patterned samples	Dror Shafir, Gilad Barak, Michal Haim YACHINI, Matthew Sendelbach, Cornel Bozdog	2020-12-29	$14,373,000
10311198	Overlay design optimization	Gilad Barak, Tal Verdene, Michal Haim YACHINI, Dror Shafir, Changman Moon	2019-06-04	$4,371,000
10209206	Method and system for determining strain distribution in a sample	Gilad Barak, Cornel Bozdog, Matthew Sendelbach	2019-02-19	$4,653,000
10054423	Optical method and system for critical dimensions and thickness characterization	Dror Shafir, Gilad Barak	2018-08-21	$3,446,000
8319975	Methods and apparatus for wavefront manipulations and improved 3-D measurements	Yoel Arieli, Emmanuel Lanzmann, Gavriel Feigin, Tal Kuzniz, Yoram Saban	2012-11-27
7609388	Spatial wavefront analysis and 3D measurement	Yoel Arieli, David Banitt, Yosi Weitzman, Yoram Saban, Emmanuel Lanzmann +1 more	2009-10-27
7542144	Spatial and spectral wavefront analysis and measurement	Yoel Arieli, Eval Shekel	2009-06-02
7327470	Spatial and spectral wavefront analysis and measurement	Yoel Arieli, Eyal Shekel	2008-02-05
6819435	Spatial and spectral wavefront analysis and measurement	Yoel Arieli, Eyal Shekel	2004-11-16
6707608	Diffractive optical element and a method for producing same	Yoel Arieli	2004-03-16

Shay Wolfling — 11 Patents

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