MY

Michal Haim YACHINI

NI Nova Measuring Instruments: 2 patents #43 of 108Top 40%
NO Nova: 1 patents #39 of 75Top 55%
Overall (All Time): #1,352,472 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11885737 Method and system for optical characterization of patterned samples Dror Shafir, Gilad Barak, Shay Wolfling, Matthew Sendelbach, Cornel Bozdog 2024-01-30
10876959 Method and system for optical characterization of patterned samples Dror Shafir, Gilad Barak, Shay Wolfling, Matthew Sendelbach, Cornel Bozdog 2020-12-29
10311198 Overlay design optimization Gilad Barak, Tal Verdene, Dror Shafir, Changman Moon, Shay Wolfling 2019-06-04