Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392733 | Combined ocd and photoreflectance method and system | Gilad Barak | 2025-08-19 |
| 12372473 | Accurate Raman spectroscopy | Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari | 2025-07-29 |
| 12366533 | Hybrid metrology method and system | Gilad Barak, Yanir Hainick | 2025-07-22 |
| 12359968 | Systems and methods for optical metrology | Eyal Hollander, Elad Schleifer, Gilad Barak | 2025-07-15 |
| 12298182 | Optical technique for material characterization | Gilad Barak | 2025-05-13 |
| 12163892 | Accurate Raman spectroscopy | Elad Schleifer, Amir Shayari, Eyal Hollander, Valery Deich, Shimon Yalov +1 more | 2024-12-10 |
| 12152993 | Accurate Raman spectroscopy | Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari | 2024-11-26 |
| 12066385 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Vladimir Machavariani | 2024-08-20 |
| 12025560 | Hybrid metrology method and system | Gilad Barak, Yanir Hainick | 2024-07-02 |
| 11927481 | Optical technique for material characterization | Gilad Barak | 2024-03-12 |
| 11906434 | Raman spectroscopy based measurement system | — | 2024-02-20 |
| 11860104 | Accurate raman spectroscopy | Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari | 2024-01-02 |
| 11802829 | Method and system for broadband photoreflectance spectroscopy | Gilad Barak | 2023-10-31 |
| 11740183 | Accurate Raman spectroscopy | Elad Schleifer, Amir Shayari, Eyal Hollander, Valery Deich, Shimon Yalov +1 more | 2023-08-29 |
| 11543294 | Optical technique for material characterization | Gilad Barak | 2023-01-03 |
| 11415519 | Accurate Raman spectroscopy | Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari | 2022-08-16 |
| 11293871 | Raman spectroscopy based measurement system | — | 2022-04-05 |
| 11275027 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Vladimir Machavariani | 2022-03-15 |
| 11150190 | Hybrid metrology method and system | Gilad Barak, Yanir Hainick | 2021-10-19 |
| 10732116 | Hybrid metrology method and system | Gilad Barak, Yanir Hainick | 2020-08-04 |
| 10564106 | Raman spectroscopy based measurements in patterned structures | Gilad Barak, Yanir Hainick, Vladimir Machavariani | 2020-02-18 |