Yonatan Oren — 22 Patents at Nova

Yonatan Oren has been granted 22 US patents while listed as an inventor at Nova. The first was granted in 2020 and the most recent in November 2025. Yonatan Oren ranks #189,202 of 4,157,543 US inventors in our database (top 4.6%). Patent records list Yonatan Oren in Kiryat Ono, IL.

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12467869	Raman spectroscopy based measurement system	—	2025-11-11
12392733	Combined ocd and photoreflectance method and system	Gilad Barak	2025-08-19
12372473	Accurate Raman spectroscopy	Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari	2025-07-29
12366533	Hybrid metrology method and system	Gilad Barak, Yanir Hainick	2025-07-22
12359968	Systems and methods for optical metrology	Eyal Hollander, Elad Schleifer, Gilad Barak	2025-07-15
12298182	Optical technique for material characterization	Gilad Barak	2025-05-13
12163892	Accurate Raman spectroscopy	Elad Schleifer, Amir Shayari, Eyal Hollander, Valery Deich, Shimon Yalov +1 more	2024-12-10
12152993	Accurate Raman spectroscopy	Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari	2024-11-26
12066385	Raman spectroscopy based measurements in patterned structures	Gilad Barak, Yanir Hainick, Vladimir Machavariani	2024-08-20
12025560	Hybrid metrology method and system	Gilad Barak, Yanir Hainick	2024-07-02
11927481	Optical technique for material characterization	Gilad Barak	2024-03-12
11906434	Raman spectroscopy based measurement system	—	2024-02-20
11860104	Accurate raman spectroscopy	Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari	2024-01-02
11802829	Method and system for broadband photoreflectance spectroscopy	Gilad Barak	2023-10-31
11740183	Accurate Raman spectroscopy	Elad Schleifer, Amir Shayari, Eyal Hollander, Valery Deich, Shimon Yalov +1 more	2023-08-29
11543294	Optical technique for material characterization	Gilad Barak	2023-01-03
11415519	Accurate Raman spectroscopy	Eyal Hollander, Gilad Barak, Elad Schleifer, Amir Shayari	2022-08-16
11293871	Raman spectroscopy based measurement system	—	2022-04-05
11275027	Raman spectroscopy based measurements in patterned structures	Gilad Barak, Yanir Hainick, Vladimir Machavariani	2022-03-15
11150190	Hybrid metrology method and system	Gilad Barak, Yanir Hainick	2021-10-19
10732116	Hybrid metrology method and system	Gilad Barak, Yanir Hainick	2020-08-04	$10,856,000
10564106	Raman spectroscopy based measurements in patterned structures	Gilad Barak, Yanir Hainick, Vladimir Machavariani	2020-02-18	$5,484,000

Yonatan Oren — 22 Patents

Issued Patents All Time

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