Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423800 | Machine learning based defect examination for semiconductor specimens | Yehonatan Hai Ofir, Yotam Nissim Ben Shoshan, Ran BADANES | 2025-09-23 |
| 12400319 | Defect examination on a semiconductor specimen | Yehonatan Hai Ofir, Yehonatan Ridelman, Ran BADANES, Boaz Cohen | 2025-08-26 |
| 12152869 | Monitoring system and method for verifying measurements in patterned structures | Boaz Brill, Igor Turovets | 2024-11-26 |
| 11340343 | Apparatus and methods for thickness and velocity measurement of flat moving materials using high frequency radar technologies | Ellis S. Waldman, Alexander M. Raykhman | 2022-05-24 |
| 10295329 | Monitoring system and method for verifying measurements in patterned structures | Boaz Brill, Igor Turovets | 2019-05-21 |
| 9367911 | Apparatus and method for defect detection including patch-to-patch comparisons | Michele Dalla-Torre, Zion Hadad, Yehuda Udy Danino, Noga Bullkich | 2016-06-14 |
| 6836449 | Acoustic method and device for distance measurement | Alexander M. Raykhman, David Freger | 2004-12-28 |